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Rietveld全谱拟合表征掺杂ZnO陶瓷 被引量:7

Doped ZnO Ceramics Characterized by Rietveld Whole Pattern Fitting
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摘要 通过Rietveld全谱拟合对掺杂多物相ZnO陶瓷的物相定量组成,所含尖晶石相的化学配比、晶粒大小和残余应力等结构参数同时进行了表征,既快又准.研究结果表明,掺杂ZnO陶瓷以保持原晶格常数和没有其它元素掺杂的较大颗粒的ZnO相为主体,高分散的Bi2O3相与尖晶石相晶粒分散于ZnO晶粒间.尖晶石相的元素组成随原料的掺杂组分配比不同而不同,利用全谱拟合精修确定了它们的元素组成. Doped ZnO ceramics have complicated XRD diffraction patterns. It is difficult to carry out qualitative, quantitative phase analysis and to determine the crystalline size and micro strain of them with traditional methods. Here we used Rietveld whole pattern fitting method to analyze them. The composition of spinel varied when the proportion of adulterant changes and it was detemined by whole pattern fitting. All the results were obtained simultaneously in fitting. Therefore the time for data processing was shorter than that the traditional methods need. And the results were more accurate than that obtained by traditional method. It was found that ceramics consist mainly of bigger ZnO grains (the lattice parameters of them are close to those in pure ZnO so they are not doped with other metals), and intergranular high dispersive Bi2O3 and spinel grains.
出处 《高等学校化学学报》 SCIE EI CAS CSCD 北大核心 2000年第5期785-788,共4页 Chemical Journal of Chinese Universities
基金 国家自然科学基金!(批准号:29573098)
关键词 Rietveld全谱拟合 结构表征 掺杂 氧化锌陶瓷 Doped ZnO ceramics Rietveld whole pattern fitting Structure characterization
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