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超大规模集成电路可靠性评估综述 被引量：3

An Overview of the Reliability Evaluation of Very Large Scale Integrated Circuits
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摘要 为适应系统级芯片（SoC）高性能的要求,超大规模集成（VLSI）电路的密度和复杂度不断增加,从而为SoC芯片的可靠性带来了严峻的挑战。因此,准确评估VLSI电路的可靠性成为一个重要问题。该文主要从不同的层面和角度综合概述了前人及本课题组对VLSI可靠性进行评估的方法和策略及其解决的问题,最后结合作者的实际工作,描述了应进一步完善的工作并指出了当前工作的不足和困难。 To meet the high performance requirements of SoC（System on Chips）,the density and complexity of VLSI is increasing contin ually,and these have negative impacts on circuit reliability.Hence,accurate reliability estimation of VLSI has become an important issue.This paper has introduced the problems and the existing reliability techniques of reliability estimation based on the early achievements.Fi nally,this paper described the further work,the deficiency and difficulties of the current work combined with the author＇s working.
作者 朱旭光 ZHU Xu-guang（Department of Computer Science and Technology,Tongji University,Shanghai 201804,China）
机构地区 同济大学计算机科学与技术系
出处 《电脑知识与技术》 2012年第1期204-206,共3页 Computer Knowledge and Technology
关键词 超大规模集成电路 系统级 寄存器传输级 逻辑级 晶体管级 可靠性评估 VLSI system level register transfer level logic level transistor level reliability evaluation
分类号 TP311 [自动化与计算机技术—计算机软件与理论]
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参考文献8

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二级参考文献25

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共引文献25

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电脑知识与技术
2012年 第1期

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