摘要
报道了Ｘ射线荧光光谱法直接测定电工硅钢钢屑样品微量元素的新方法，校正了样品中元素间的基体效应影响和校正了钢屑样品的不同颗粒结构，不同几何形态及不同表面状态的影响，使钢屑样品可不经处理直接测定，操作简便。
The new method of direct determination of micro amounts of elements in electrician silicon steel chips is based on the high performance of PW 2400 X ray fluorescence spectrometer system and its software.It can correct both the matrix effect and the influence of sample physical status.Specimens of steel chips can be determined directly without any pretreatment.The method has high accuracy and precision,the operation is easy and the analysis is fast.
出处
《分析试验室》
CAS
CSCD
1999年第6期59-62,共4页
Chinese Journal of Analysis Laboratory
