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FTIR Study of C-implanted 4H-SiC Single Crystal after Swift Pb-ion Irradiation

FTIR Study of C-implanted 4H-SiC Single Crystal after Swift Pb-ion Irradiation
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摘要 Due to its extraordinary properties, such as wide band gap, high electronic drift velocity, high electric breakdown field,and excellent chemical and thermal stability, silicon carbide has been of technical importance for high temperature, high frequency, and high power electronic devices and is attracting more attention. In device processing ion implantation is an important technological procedure. But the Due to its extraordinary properties, such as wide band gap, high electronic drift velocity, high electric breakdown field,and excellent chemical and thermal stability, silicon carbide has been of technical importance for high temperature, high frequency, and high power electronic devices and is attracting more attention.
出处 《近代物理研究所和兰州重离子加速器实验室年报:英文版》 2005年第1期66-66,共1页 IMP & HIRFL Annual Report
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