摘要
石英晶体微天平仪(QCM)具有高度的灵敏性,能够对石英晶片表面微痕量物质的变化产生响应,在分析科学研究中广泛应用。本文阐述了QCM的基本工作原理和应用基础方程,并在此基础上综述了近年来QCM在聚合物薄膜研究中的应用及研究进展,包括QCM对聚合物薄膜的厚度和力学性能的测量、QCM研究聚合物分子链在石英晶片表面的吸附过程和链构象变化、表面引发生长聚合物刷的动力学过程、基于功能聚合物薄膜和QCM的生物与化学传感器等,同时对QCM在聚合物薄膜研究领域的进一步深入应用进行了展望。
Quartz crystal microbalance（QCM） has high sensitivity and can response to the change of trace matter on the surface of quartz crystal. QCM can be used to detect the mass change in nanogram scale and the thickness change in nanometer scale, which has extensive applications in diversely research fields of analytical chemistry. In this article, the working principle and basic equations of QCM were illustrated. The recent applications and advances of QCM analysis in the studies of polymer thin film were then reviewed, including the measurement of thickness and mechanical properties of the polymer thin film, the adsorption and conformation evolution of polymer chains on the surface of quartz crystal, the polymerization kinetics of surface initiated polymer brushes, chemical-and bio-sensors based on functional polymer thin film and QCM, and so on. The further applications and development of QCM analysis in the research field of polymer thin film were also discussed.
出处
《分析化学》
SCIE
EI
CAS
CSCD
北大核心
2010年第5期752-759,共8页
Chinese Journal of Analytical Chemistry
基金
国家自然科学基金(Nos.20604022
20874087)
863科技计划(No.2009AA04Z125)资助项目
关键词
聚合物薄膜
石英晶体微天平
评述
Polymer thin film
Quartz crystal microbalance
Review
