摘要
文中对既包含JTAG芯片又包含非JTAG芯片的混合技术电路板的设计问题进行了深入的研究,构造了两种优化设计算法。应用这两种算法设计的电路,不仅可以满足应用JTAG机制对所有芯片进行测试的要求——可测试必要条件,而且具备最低的整体费用。文中给出了具体的算法,并用实例对算法进行了说明。
It is disucssed in this paper how to optimize the design of mixed-technology circuit. A mixed-technology circuit contains Non-JTAG chips as well as JTAG chips. Two effective algorithms are given with illustration examples. The circuits designed using these algorithms have two features. First,they have the minimum total cost. Second,all the chips on them can be tested by JTAG data acquisition channel,i. e. satisfying the so called testable condition.
出处
《电子测量技术》
1999年第1期4-7,共4页
Electronic Measurement Technology
