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数字电位器的数学模型及测试技术 被引量:2

Topology and test technology of digitally controlled potentiometers
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摘要 数字电位器是一种颇具发展前景的新型电子器件,可在许多领域取代传统的机械电位器。单片机通过接口电路对数字电位器进行编程,即可构成可编程增益放大器、可编程滤波器等各种可编程模拟器件,实现"把模拟器件放到总线上"(即微控制器通过总线来控制系统中的模拟功能块)这一全新的设计理念。首先建立了数字电位器(DCP)的拓扑结构,不仅从本质上表述了数字电位器的调节特性及内部2个电阻变量的依存关系,为深入分析数字电位器在模拟电路中的工作特性提供了便利条件。阐述了数字电位器的测试电路原理、测试方法、测试数据及注意事项。 The digitally controlled potentiometers (DCP) is a new type of electronic device, which has good development prospect. And the DCP can replace the traditional mechanical potentiometer in many fields. Through controlling the DCP by MCU, a programmable gain amplifier, a programmable filter and other programmable analogy devices can be composed. Through this method, the new design technology of "put the analogy device onto the bus", which means the MCU controls the analogy modules through bus, can be realized. Firstly the topology of the DCP is set up, which can indicate the adjustable characters and dependence relationship between the internal two resisters. The topology of the DCP also provides conditions for analyzing the operation characters of the DCP in the analogy circuit. Finally the test circuit's principle, test methods, test data and note items of the DCP are expatiated upon.
出处 《河北科技大学学报》 CAS 北大核心 2010年第2期116-119,131,共5页 Journal of Hebei University of Science and Technology
关键词 数字电位器 数学模型 测试电路 非线性误差 digitally controlled potentiometers mathemmatical model test circuit nonlinear error
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