摘要
聚合物微晶尺寸和晶格畸变是对聚合物材料性能有着重要影响的结构参数。本文介绍了应用Ｘ射线衍射方法测定聚合物微晶尺寸和结构畸变的几种方法：近似函数、次晶模型法、方差法、矩法。
In this paper five kinds of method to calculate crystallite size and lattice distortion for the analysis of polymer X ray diffraction line broadening were reviewed.Five kinds of method are the approximation function method,Hosemann paracrystalline structural variance analysis method,Wilson variance method,Variance range function method and fourth central moment method.Use ways and conditions for the methods above mentioned were described in more detail,and given some applied examples in our laboratory.
出处
《高分子通报》
CAS
CSCD
1998年第4期41-48,共8页
Polymer Bulletin
关键词
聚合物
X射线衍射
微晶尺寸和结构畸变
Polymer, X ray diffraction line broadening,Crystallite size and lattice distortion
