期刊文献+

基于AFM的纳米梁杨氏模量和残余应力测量 被引量:8

Measurement of young’s modulus and residual stress of nanobeam using AFM
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摘要 针对同一工艺流程下相同杨氏模量和残余应力的双端固支梁阵列,建立了简化的杨氏模量和残余拉应力的弯曲测试模型,并将应力刚化理论应用到几何非线性有限元分析中用于上述模型的理论误差评价。提出将拉曼频移测试与原子力显微镜(AFM)弯曲测试相结合的实验方案,首先利用拉曼频移判断结构中的应力拉压性质,随后利用AFM测量梁阵列的弹性系数,最终利用MATLAB求解超定方程组的方法解得梁阵列的杨氏模量和残余应力,测试结果证明了该实验方案的可行性。 A simplified bending test model of Young's modulus and residual stress is set up for fixed-fixed beam array fabricated in one process with same Young's modulus and residual stress. Stress strengthening theory is applied in the geometry-nonlinear finite element model so as to estimate the theoretical errors of the bending model. An experimental strategy of combining Raman shift test and AFM bending test is brought forward. The tensile or compressive property of the residual stress in the measured structure is judged using the value of Raman shift, and then the spring constants of the measured structures are measured using the force curve mode of AFM. Finally, a program for solving the overdetermined equation realized by MATLAB is used for the calculation of the values of Young's modulus and residual stress. Experimental results illustrate the feasibility of the proposed model and the corresponding experimental strategy.
出处 《仪器仪表学报》 EI CAS CSCD 北大核心 2010年第1期201-207,共7页 Chinese Journal of Scientific Instrument
基金 科技部国际科技合作与交流专项(2008DFA71610) 国家自然基金重点(50535030)
关键词 纳米梁 杨氏模量 残余应力 原子力显微镜 弯曲测试 nanobeam young's modulus residual stress AFM bending test
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参考文献10

  • 1MASTRANGELO C H, TAI Y C, MULLER R S. Thermophysical Properties of Low-residual Stress, Silicon-rich, LPCVD Silicon Nitride Films [J]. Sensors & Actuators, A21-23, 1990: 856-860.
  • 2韩光平,刘凯,王秀红.单晶硅微桥式梁力学性能的弯曲测试[J].仪器仪表学报,2006,27(2):176-179. 被引量:5
  • 3朱守星,丁建宁,范真,蔡兰.用AFM压痕技术定量介观硬度的方法研究[J].仪器仪表学报,2005,26(3):272-274. 被引量:3
  • 4东北科技大学,东北大学.工程力学(材料力学)[M].北京:高等教育出版社,1997.
  • 5Gere Timoshenko.材料力学[M].北京:晓园出版社,1985.
  • 6雷茨.RFMEMS理论.设计.技术[M].南京:东南大学出版社,2005.
  • 7OSTERBERG PETER M, STEPHEN D. M-TEST: A test chip for MEMS material property measurement using electrostatically actuated test structures [J]. Journal of Microelectromechanical Systems, 1997, 6(3): 107-118.
  • 8BRIAN D J, MAARTEN P DE B, SAMUEL L M. IMaP: Interferometry for material property measurement in MEMS [C] MSM '99. San Juan, Puerto Rico, USA: NSTI, 1999: 206-209.
  • 9TIMOSHENKO S EGERE J M. Mechanics of materials [M]. New York: Van Nostrand Reinhold Company, 1972.
  • 10熊继军,张文栋,薛晨阳,桑胜波,周兆英.拉曼光谱应用于硅微悬臂梁的应力特性测试[J].中国机械工程,2005,16(14):1292-1295. 被引量:6

二级参考文献34

  • 1XUE ZHENYU,TAHER M,SAIF A,et al. The strain gradient effect in microelectromechanical systems (MEMS) [J]. Journal of Microelectromechanical Systems, 2002,11(2):27-35.
  • 2SERRY F MICHAEL,WALLISER DIRK, MACLAY G Jordan. The anharmonic Casimir oscillator (ACO)--the Casimir effect in a model microelectromechanical system [J]. Journal of Microelectromechanical Systems,1995,4(4):193-205.
  • 3SRIRAM S. Micro/nanoscale tribology and mechanics of components and coatings for MEMS[D]. Ohio:the Ohio State University, 2002:1-24.
  • 4READ D T. Pizo-actuated microtensile test apparatus [J]. Testing and Evaluation, 1998,26:255-259.
  • 5AMATO IVAN. Fomenting a revolution, in miniature [J]. Science,1998,282:402-405.
  • 6SHARPE W N,Jr., et al. A new technique for measuring the mechanical properties of thin films [J]. Journal of Microelectromechanical Systems, 1997,6(3):193-199.
  • 7SUNDARARAJAN S, BHUSHAN BHARAT, et al. Mechanical property measurements of nanoscale structures using an atomic force microscope [J]. Ultramicroscopy,2002,91:111-118.
  • 8MARTINEZ E, ANDUJAR J L,et al. Study of mechanical properties of tetrahedral amorphous carbon films by nanoindentation and nanowear measurements [J]. Diamond and Related Materials, 2001, 10:145-152.
  • 9ZHANG T Y,SU Y J,ZHAO M H. Microbridge testing of silicon nitride thin films deposited on silicon wafers [J]. Acta Materialia, 2000,48(11):2843-2857.
  • 10OLIVER W C,PHARR G M. An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments [J]. J. Mater. Res., 1992, 17:1564-1583.

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