摘要
图解辅以计算研究了镀制减反射膜的半导体激光器镀膜面的有效反射。由于减反膜自身反射率曲线的波长依赖性和谱线宽度的有限性,故一般情况下镀膜面的实际反射率比减反膜自身的最低反射率高。针对这种情况,我们进一步讨论了如何通过选择最低反射率所处的波长来提高减反射膜的有效性。
The graphical analysis as well as numerical calculation has been used to study the effective reflectivity at antireflection coated facets of semiconductor lasers. Due to the wavelength dependence and finite spectral width of the reflection curve, the reflectivity which takes effect is generally higher than the minimum reflectivity claimed. Accounts have also been made on the choice of the wavelength, where the reflectivity is minimized,in order to increase the effectiveness of the antireflection coatings.
出处
《激光技术》
CAS
CSCD
北大核心
1998年第4期246-249,共4页
Laser Technology
基金
国家自然科学基金
关键词
半导体激光器
减反射膜
反射率
图解法
semiconductor laser antireflection film reflectivity graphical analysis