摘要
分析了电容式纱条均匀度仪和光电式纱线外观测试分析仪的测试原理,并采用两种方法分别测试同一组试样的常发性纱疵,结果发现,两者的测试数据不同,但具有一定的相关性。
In this paper is analyzed the testing principle of capacitor - type evenness tester and photoelectric yam appearance tester. And these two testing methods are used respectively to measure the normal yarn faults of the same samples. The result shows that the values obtained by the two meters are different while they correlate with each other.
出处
《上海纺织科技》
北大核心
2009年第9期37-39,共3页
Shanghai Textile Science & Technology
基金
2007年度纺织面料技术教育部重点实验室开放基金资助项目(703)
关键词
纱疵
检测
相关分析
yarn faults
detection
relative analysis
