摘要
利用WFZ—D4型紫外／可见分光光度计测量了超薄Al膜可见光吸收率与膜厚变化的关系．结果表明，在薄膜生长的不同厚度阶段具有不同的吸收特性，吸收率存在明显的尺寸效应.随着薄膜厚度减小，吸收率具有极大值.与直流电导率实验结果对比分析，结构特征变化是导致吸收率尺寸效应的重要原因．
The visible absorptance of the ultrathin aluminum film has been measured by WFZ900-D4 UV/VIS spectrophotometer. The result indicates that the absorptance is a function of film thickness and has obvious size effect. With decreasing the film thickness, the maximum absorptance appears. Comparing to electric conductivity characteristic of the film,unique structure feature leads to the size effect of the absorptance of the ultrathin aluminum film.
出处
《金属学报》
SCIE
EI
CAS
CSCD
北大核心
1998年第9期1005-1008,共4页
Acta Metallurgica Sinica
