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X射线荧光光谱分析中基体效应的数学校正方法新探 被引量:17

A NEW APPROACH TO CORRECTION METHOD FOR MATRIX EFFECT IN X-RAY FLUORESCENCE SPECTROSCOPY ANALYSIS
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摘要 用开发的TBHXRF基本参数法程序计算了复杂样品的基体效应。提出一个修正多元体系基体效应的校正数学模型和计算影响系数α及β,导出的校正模式及影响系数的物理意义清楚、明确。用该法分析了不锈钢样品获得良好的结果。还指出在某些情况中,三次荧光的影响不能忽略,从对比实验中得出结论,对Ni浓度高的钢铁样品在分析Cr时,必须考虑Ni、Fe对CrKα的三次荧光效应影响。 With the help of fundamental parameter program developed by the authors,the matrix effect of multicomponent complex sample and the composition of each element′s X ray fluorescence intensity are calculated.A new mathematical model for correcting multicomponent matrix effect is deduced theoretically.This model provides a new method to calculate influence coefficients α and β.The correction model and the influence coefficients introduced by this paper have clear and definite physical meaning,which give satisfactory result when utilized in analyzing stainless steel sample.The paper also indicates that the effect of tertiary fluorescence can not be neglected in some cases.From the result of comparison experiments,we draw a conclusion that the tertiary fluorescence effect must be considered while analyzing Cr in a steel sample with high concentration of Ni.
出处 《光谱学与光谱分析》 SCIE EI CAS CSCD 北大核心 1998年第3期366-371,共6页 Spectroscopy and Spectral Analysis
关键词 X射线荧光分析 基体效应 基本参数法 不锈钢 X Ray fluorescence analysis, Matrix effect, Fundamental parameter method, Stainless steel
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