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CVD 法 TiO_2 薄膜的制备条件及光学性质的研究 被引量:8

Study on Deposition Condition and Optical Properties of TiO 2 Films Deposited by Chemical Vapour Deposition
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摘要 以四异丙醇钛(简称TPT)为钛源物质,采用常压化学气相沉积(CVD)法制备了TiO2膜,并对其光学性质进行了研究。实验结果表明:沉积条件是影响TiO2膜的沉积率和光学性质的重要因素。在可见光和近红外区,TiO2薄膜的透射率在68%~85%之间,折光率n=1.75~2.2,消光系数k=2×10-3~9×10-3,带隙能Eg=0.5~1.87eV,制得的TiO2膜均匀细密,膜厚为200nm~450nm。用x-ray扫描仪测得400℃~700℃时,TiO2膜为锐钛矿结构,400℃以下为无定形结构。 TiO 2 thin films were prepared by chemical vapour deposition(CVD) with the source of tetra iso propyl titanate (Tiliso OC 3H 7) 4,TPT) and its optical properties are studied.The experimental results show that the deposition rate and optical properties of TiO 2 films depend on deposition conditions.In the visible and near infrayed regions(300 nm~900 nm),TiO 2 films deposited at different deposition conditions had a transmittance T varying in 68%~85%,a refractive index n in 1.75~2.2,an extinction coefficient k in 2×10 -3 ~9×10 -3 ,an optical band gap in 0.5 eV~1.7 deV, and the thickness of TiO 2 film is 200 nm~450 nm.TiO 2 films are polycrystalline structure of anatase at 400℃~700℃ ,and amorphous structure at lower than 400℃.
出处 《太原理工大学学报》 CAS 1998年第3期240-243,共4页 Journal of Taiyuan University of Technology
基金 山西省留学归国人员基金
关键词 化学气相沉积 二氧化钛薄膜 光学性质 chemical vapour deposition TiO 2 thin film deposition rate,refractive index,extinction coefficient
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