摘要
ＺｒＯ２·ＳｉＯ２·Ｐ２Ｏ５半导陶瓷是由ＺｒＯ２，ＳｉＯ２和Ｈ３ＰＯ４用高温固相反应制成．它的傅里叶红外吸收谱是由ＺｒＯ２和ＳｉＯ２的标准谱叠加而成，根据标准峰的位置分别计算出两种氧化物的四个基本声子能量．这些声子按照不同组合方式形成ＺｒＯ２·ＳｉＯ２·Ｐ２Ｏ５半导陶瓷的全部傅里叶红外吸收峰．半导陶瓷表面的每一个激光拉曼背向散射峰也是由这些基本声子组合而成．
ZrO2·SiO2·P2O5 semiconducting ceramic is made of ZrO2,SiO2 and H3PO4 by the solid phase reaction at high temperature.Its Fourier infrared absorption spectrum is the overlap between standard ones of ZrO2 and SiO2.On the basis of the standard peak sites,four fundamental phonon energies of two oxides are calculated respectively.All the Fourier infrared absorption peaks of ZrO2·SiO2·P2O5 semiconducting ceramics,consist of the four elementary phonons by different combination.Each Laser Raman backward scattering peak of ZrO2·SiO2·P2O5 semiconducting ceramic surface,is made up of these phonons yet.
出处
《云南大学学报（自然科学版）》
CAS
CSCD
1998年第S1期76-80,共5页
Journal of Yunnan University(Natural Sciences Edition)
关键词
红外吸收谱
拉曼散射谱
半导陶瓷
infrared abscrption spectra,Raman spectra,semiconducting ceramic
