摘要
利用正电子湮没谱（ＰＡＳ）分析技术对超细粉α＿Ａｌ２Ｏ３陶瓷基片（板）的烧结反应过程进行了检测研究。对在４种不同的温度下得到的烧结体作ＰＡＳ分析研究，发现正电子寿命敏感于烧结温度以及不同温度下的微结构效应。根据ＰＡＳ数据分析，对超细粉陶瓷烧结体的微结构缺陷及温度－相变关系作了初步探索。
The sintering process of ultrafine α-Al_2O_3 particles in ceramic substrates has been studied with positron annihilation spectroscopy (PAS).Positron annihilation spectra of four sintered specimens prepared at four different temperatures were obtained.It was found that the positron lifespan is sensitive to the sintering temperature and microstructural effects under different temperatures. Some preliminary discussions on micro_structural defects and the temperature dependence of phase transition have been made.
出处
《分析测试学报》
CAS
CSCD
1998年第2期31-33,共3页
Journal of Instrumental Analysis
关键词
氧化铝
正电子谱
超细粉
烧结反应
陶瓷基片
Alumina, Ceramic,Positron annihilation spectrum, Defect,Microstructure
