摘要
研究了Sn3.8Ag0.7Cu1.0Y钎料表层上YSn3稀土相表面Sn晶须的生长行为。结果表明:室温时效条件下在YSn3的表面会出现Sn晶须的快速生长现象,生长速度最快可达10–10m/s,长度最长可达200μm。YSn3稀土相氧化的不均匀性是导致Sn晶须在生长时产生各种旋转现象的主要原因。
Researched the Sn whiskers growth behavior was on the surface of YSn3RE-phase on Sn3.8Ag0.7Cu1.0Y solder. Results show that there appears rapid growth of tin whiskers with growth rate up to 10^-10m/s and length up to 200 um on the surface of YSn3RE-phase under room-temperature aging. YSn3RE-phase unequal oxidation is main reason to result in rotational phenomena of Sn whisker growing.
出处
《电子元件与材料》
CAS
CSCD
北大核心
2008年第11期54-56,共3页
Electronic Components And Materials
基金
"十一五"国家科技支撑重点资助项目(No.2006BAE03B02)