摘要
提出一种新的折射率测量方法。利用倾斜平行平板会引起出射光束位置平移的测量原理。同线阵ＣＣＤ探测产生了位移的光束，通过计算程序实时算出样品折射率。为了证实这种方法的可行性，本文作者建立了一个由Ｈｅ－Ｎｅ激光器、透镜组、ＣＣＤ传感器和单片机组成的实验系统，具体研制了硬件和软件，对厚度ｔ＝１５ｍｍ，倾角θ＝４５°的Ｋ９玻璃进行了实际折射率测量。折射率在１．４～１．９之间时，该方法能达到小数点后四位以上的测量精度，测量速度快，自动化程度高，而且系统简单，造价低，适用范围广，对于可见光、红外、紫外波段的光学材料以及气体、液体等的折射率或者厚度均可用此方法测量。
A new method for measuring refractive index is proposed in the paper.The displaced position of the beam will be detected by the linear CCD by use of the measuring principle that the displacement of the outgoing beam can be caused by the tilted parallel plate.The sample refractive index can be calculated at real time with computer program.An experimental system consisting of He-Ne laser,lenses,CCD sensor and single chip computer has been built in order to demonstrate the feasibility of the method.The practical refractive index measurement for K 9 glass with thickness t =15mm and inclination angle θ =45° has been carried out wiht the developed hardware and software.Over 4 bit measuring accuracy behind the decimal point can be obtained by the method when the refractive index is within the range of 1.4￣1.9.The system has the advantages of fast measuring speed.high automation,simple system structure.low cost and wide appliction range.The measuring method is applicable to the measurement of refractive index or thickness of optical materials,gas and liquid used in visible,IR and UV wavelengths.
出处
《光电工程》
CAS
CSCD
1997年第4期26-30,共5页
Opto-Electronic Engineering
关键词
折射率测量
CCD图象传感器
氦氖激光器
Refractivity measurement,CCD image sensors,He-Ne lasers,Single chip processors.
