摘要
对近十年来用原子吸收光谱法测定硅的情况进行评述．重点介绍用石墨炉测定硅时，为了避免硅与石墨炉中碳形成难熔碳化硅影响测定硅的灵敏度而使用的各种化学改进剂，涂层石墨管和一些新的实验技术．引用参考文献４２篇．
The determination of Si by AAS in recent ten years was reviewed in this papen. Emphasis is how to avoid the formation of refractory silicon carbide and the improvement of sensitivity of Si with graphite furnace through the use of various chemical modifiers, coated graphite tubes and new experimental techniques.
出处
《分析科学学报》
CAS
CSCD
1997年第4期341-345,共5页
Journal of Analytical Science
关键词
硅
原子吸收光谱
化学改进剂
涂层石墨管
Silicon, Atomic absorption spectrometry, Chemical modifier, Coated graphite tube, Review
