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MEMS微悬臂梁在冲击环境下的可靠性 被引量:10

Reliability for MEMS micro-cantilevers under shock load
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摘要 由于MEMS器件的可靠性成为MEMS产品商业化过程中一个重要问题,而冲击断裂是导致器件失效的一个重要原因。本文主要研究多晶硅微悬臂梁在冲击条件下的可靠性,文中阐述了断裂失效机理,并使用应力-强度模型对可靠度进行建模。通过实验统计在各种加速度冲击下的可靠度,并将实验实测值与理论值进行对比。 The reliability of MEMS is a key problem for its commercial application. Fracture is a important factor for the failure. In this paper, we mainly focus on fracture Reliability for poly - silicon micro - cantilevers under shock load, expatiate on the failure mechanism of Fracture, and build a model using stress - strength principle. A lot of data will be collected after the shock experiment. Then the comparison between the experimental curve and the theoretic curve would be presented.
出处 《功能材料与器件学报》 CAS CSCD 北大核心 2008年第1期103-106,共4页 Journal of Functional Materials and Devices
基金 装备预先研究项目
关键词 MEMS 冲击失效 可靠度 MEMS shock failure reliability
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参考文献7

  • 1Wagner U, Franz J,Schweiker M. Mechanical Reliability of MEMS - structures under shock load[ J ]. MicroelectronicsReliability, 2001,41 : 1657 - 1662.
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