摘要
本文报道了Au／a－Ge双层膜的分形晶化现象，并首次测量了An／a－Ge双层膜分形晶化的V－I特性．实验结果表明：分形晶化后的An／a－Ge双层膜具有反常的非线性V－I特征，应用隧道结网络（RTJN）模型对实验结果给予了合理的解释．
The fractal crystallization phenomenon of the An/a-Ge bilayer film has been investigated, and the V-I characteristic of the film has been measured for the first time. The experimental evidence suggests that the An/a-Ge film after fractal crystallization has anomalous nonlinear V-I characteristic. The phenomenon is explained by the Random Tunneling Junction Network mode (RTJN mode).
基金
国家自然科学基金
