摘要
采用有限元法,分析了在屏蔽壳体上的孔径中穿入导线时对电磁泄漏的影响情况,并给出了实测数据、等效电路模型和物理解释。与一般的孔缝泄漏情况不同,当孔径中央有导线穿过时,电磁能量泄漏现象显著增强。即使穿入的导线总长度相同,导线向屏蔽壳体内部延伸越多则泄漏越严重。若孔径中穿入的导线与壳体相接触则电磁泄漏现象比较复杂。孔径中穿入导线以后,其泄漏效果仿佛是向孔径中加入了一个泄漏驱动源,因此称为"导线驱动孔径"。
The effects of electromagnetic energy leaking through ＂conductor driving aperture＂ are studied with Finite Element Method （FEM）. The measurement data, equivalent circuit model and physical explanation for the leakage phenomenon are provided, too. The energy leakage through an aperture will increase drastically if a conductor wire is inserted into the center of the aperture. What＇s more, the leakage will be worse if the conductor wire inserted into the aperture is extended more into the enclosure. The leakage phenomenon becomes more complicated when the conductor wire contacts with the aperture. When a conductor wire is inserted in the aperture the electromagnetic energy leakage effect appears as if there were a driving source in the aperture ; therefore this phenomenon is referred to as ＂Conductor Driving Airflow Aperture＂.
出处
《电子测量与仪器学报》
CSCD
2007年第4期41-45,共5页
Journal of Electronic Measurement and Instrumentation
关键词
孔缝泄漏
屏蔽效能
导体驱动孔径
有限元方法
aperture leakage, shielding effectiveness, conductor driving aperture, FEM
