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直流低电压校准的测量不确定度分析 被引量:2

Analysis of measurement uncertainty for DC low voltage calibration
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摘要 对基于自行研制出的低热电势分压箱、程控开关、精密控温机柜与若干标准仪器组建的直流低电压校准装置实施校准测量的不确定度来源进行了全面分析,并对若干典型值进行了定量评定。结果表明,该装置在1μV量值的测量不确定度为2.2%,适用于对直流数字纳伏表的校准。 Based on the low EMF divider and temperature-controlled box and other standard instrument, the low .DC voltage calibration system is built. The measurement uncertainty sources are analyzed, and the typical value is given. The results show that the measurement uncertainty at 1μV is 2.2%, so that it is satisfied for calibration for DC digital nanovoltmeter.
出处 《电测与仪表》 北大核心 2007年第4期1-4,12,共5页 Electrical Measurement & Instrumentation
关键词 直流低电压 校准 测量不确定度 分析 DC low voltage calibration measurement uncertainty analysis
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参考文献6

  • 1Langstaff S.A. Self calibrating digital nanovoltmeter [A]. CPEM'90 Conference Diges4 June 1990.
  • 2胡毅飞,赵伟,朱珠,康焱,黄晶,李晓燕.直流数字纳伏表校准装置研究[J].计量学报,2007,28(1):5-9. 被引量:8
  • 3曾令儒,等.电磁学计量.国防军工计量培训教材[M].北京:原子能出版社.2002.
  • 4Zhou Gengru, Hu Yifei, Wang Lu. Automatic Calibration for Standard Cell by Using the Josephson Array Voltage Standard[C].国际无线电科学会议论文集(北京),1995
  • 5Marshall J.A, G.arrett J D, Dziuba R.F. A low thermal guarded scanner for high resistance measurement systems. PEM '96[C].June ,1996.
  • 6Witt TJ. Using the Allan variance and power spectral density to characterize dc nano-voltmeters. Precision Electromagnetic Measurements Conference Digest[Z].May 2000.

二级参考文献6

  • 1曾令儒.电磁学计量[M].北京:原子能出版社,2002.
  • 2Langstaff S A.Self calibrating digital nanovoltmeter[A].CPEM '90 Conference Digest[C],June 1990.
  • 3Witt T J.Using the Allan variance and power spectral density to characterize dc nanovoltmeters[A].Precision Electromagnetic Measurements Conference Digest[C],May 2000.
  • 4Fluke Corporation.校准理论与实践[M].汪铁华译.北京:中国计量出版社,2000.
  • 5Zhou Gengru,Hu Yifei,Wang Lu.Automatic Calibration for Standard Cell by Using the Josephson Array Voltage Standard[A].国际无线电科学会议论文集[C],北京:1995.
  • 6Marshall J A,Garrett J D,Dziuba R F.A low thermal guarded scanner for high resistance measurement systems[A].PEM'96[C],June 1996.

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