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并五苯的溶解及其薄膜性能表征 被引量：2

Dissolving Pentacene and Characterizing Pantecene Thin Films Fabricated from the Solution
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摘要 报道了并五苯的邻-1,2-氯苯溶液的制备方法及在Si和SiO2表面形成的固态薄膜的紫外-可见光光谱(UV-Vis)、光学显微镜、扫描电镜(SEM)、原子力显微镜(AFM)和X射线衍射(XRD)的表征结果.该溶液在100℃左右能形成较大面积、较均匀的多晶并五苯薄膜. This paper reports a method for fabricating pentacene o-dichlorobenzene solution. Uniform and larger-area polycrystal pentacene thin films are obtained at about 100℃. The thin films formed on Si and SiO2 surfaces are characterized by UV-Vis absorption spectrum, optical microscopy, scanning electron microscopy, atomic force microscopy, and X-ray diffraction spectroscopy.
作者 张旭辉 陶春兰 张福甲 刘一阳 张浩力
机构地区 兰州大学物理科学与技术学院 兰州大学化学化工学院功能有机分子化学国家重点实验室
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2006年第10期1771-1775,共5页 半导体学报（英文版）
基金 国家自然科学基金资助项目(批准号:60276026)~~
关键词 并五苯溶液 薄膜 UV-VIS AFM SEM XRD pentacene solution thin films UV-Vis AFM SEM XRD
分类号 TN304 [电子电信—物理电子学]
  • 相关文献

参考文献21

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共引文献22

同被引文献20

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  • 3刘雅玲,李洪祥,胡文平,朱道本.有机单晶场效应晶体管[J].化学进展,2006,18(2):189-199. 被引量：3
  • 4陶春兰,张旭辉,董茂军,欧谷平,张福甲,刘一阳,张浩力.并五苯薄膜的AFM及XRD研究[J].功能材料,2007,38(5):740-742. 被引量：2
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引证文献2

Journal of Semiconductors
2006年 第10期

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