摘要
对于工业和医学中常见的颗粒图像,提出了一种快速分割粘连颗粒的方法。利用颗粒图像的轮廓特征,找到若干拐点,从拐点中进一步提取出分割点。然后利用分割点的相互距离等因素,为每个分割点找到相匹配的分割点。连接每对分割点即可分开相粘连的颗粒。这种方法快速有效,取得了良好的效果。
A fast method to segment overlapped objects is presented in this paper. Candidate inflexions are positioned by the contour concavity. Vital inflexions are then extracted from these points. The line connecting the inflexion and its relative one will be the split line. This method is fast and effective.
出处
《微处理机》
2006年第4期80-81,共2页
Microprocessors
关键词
颗粒分割
拐点
Image Segmentation
Inflexion
