摘要
电子元器件长期贮存过程发生的失效是由多种失效机理共同作用的结果,以器件贮存寿命整体为基础的寿命评价难度很大。选择对器件贮存寿命影响最大的单一失效机理,以失效物理为基础,通过高加速应力试验进行寿命评价研究,获得的寿命可以较准确地反映器件真实的贮存寿命。单一失效机理贮存寿命的研究是元器件贮存可靠性工作的重要内容。
It is very difficult to evaluate the long-term storage life of electronic components and devices, because of the interaction of multi failure mechanisms. It is believed that relatively valid storage life of actual components can be achieved by selecting the dominated single failure mechanism and evaluating the storage life through high accelerating test.
出处
《电子产品可靠性与环境试验》
2006年第4期23-25,共3页
Electronic Product Reliability and Environmental Testing
关键词
元器件
贮存寿命
失效机理
electronic components
storage life
failure mechanism
