摘要
通过在超薄金属层上蒸镀C_(60)时的电阻原位测量,我们发现在平均厚度约一个C_(60)单层范围内样品电阻有明显可观测的变化,电阻变化的方向和幅度与金属层厚度以及金属材料的种类有关。这一新的现象揭示出有可能利用宏观物理性质测量来间接研究C_(60)-金属界面相互作用,从而对常规微观谱测量的结果给出旁证和补充。
By measuring the resistance in situ during the deposition of C_(60) on ultra-thin metal layers at UHV system,we find that the change of sample resistance isuniversal and it is very sensitive to the thickness of the precusor metal films and thecharacteristics of the employed metal materials.This sensitivity of resistancechange in metal-C_(60) multilayers (bilayers) may be related to the charge transfer ofmetal to C_(60) and surface bonding effects,hence can be used as a newpossible ap-proach to probe the interfacial interactions between C_(60) and metals.
出处
《北京大学学报（自然科学版）》
CAS
CSCD
北大核心
1996年第1期45-51,共7页
Acta Scientiarum Naturalium Universitatis Pekinensis
