摘要
地面模拟研究了低能质子和电子对铝膜反射镜光学性能的影响。结果表明，低能质子辐照后，在200～800nm波长范围内铝膜反射镜反射率随辐照剂量增加而下降。质子辐照能量越低射程越短，则反射镜表面膜层中质子浓度越大损伤也更为明显。电子辐照射程较深，辐照作用对铝膜反射镜光学性能影响很小。
Under ground simulation for the space radiation environment of protons and electrons with low energy, the influence on optical performance of aluminum （Al） film reflector was studied. The research results show that in the proton radiation experiment, the specular reflectance of AI film reflectors decreases with increasing radiation fluence in the wavelength interval 200nm-800nm. The lower the proton energy is, the relatively shorter the penetration depth of the protons into film layers of reflector will be. Therefore, the protons are mainly concentrated on the film layers, which induce more damages. However, little influence on specular reflectance of reflector is found in the electron radiation experiment for longer electron penetration depth.
出处
《光电工程》
EI
CAS
CSCD
北大核心
2006年第5期141-144,共4页
Opto-Electronic Engineering
关键词
反射镜
辐照效应
低能粒子
反射率
Reflector
Radiation effect
Low-energy particle
Reflectance
