摘要
简要分析了传统集成电路(ASIC)验证方法的特点以及将这些方法应用于系统级芯片(SoC)验证时所面临的问题。在此基础上,论述说明了模块级验证是提高SoC验证效率的基础;而基于随机测试激励的验证方法能够提升SoC的功能验证的覆盖率。另外,还介绍了用于SoC功能验证的关键方法,包括断言和RTL形式验证,Farm,随机化测试激励和功能覆盖等。
This paper first analyzes the difficulties the traditional ASIC verification method will face for SoC verification. Then the paper shows that： through block level verification will improve the SoC functional verification efficiency; Constrained Random Test bench Automation technology will increase the functional coverage for SoC verification. Some other techniques are also introduced in this paper including： Assertion and RTL Formal verification, Farm, Random Test Stimulus and Functional Coverage.
出处
《微处理机》
2006年第2期11-13,共3页
Microprocessors
关键词
系统级芯片
设计
功能验证
断言
功能测试
随机测试激励
SoC （ System on a Chip）
Design
Verification
Assertion
Functional Verification
Random Test Stimulus
