期刊文献+

复杂控制系统故障诊断方法分析 被引量:1

Analysis of Fault Diagnosis for Complicated Control System
在线阅读 下载PDF
导出
摘要 分模块介绍了复杂控制系统故障诊断的相关方法,重点讨论了自诊断自测试技术,并提出复杂控制系统中开展自诊断自测试技术研究的一些思路与方法。 Related fault diagnosis method is presented for complicated control system based on modularizing mode. Through discussing especially the selfdiagnosis and self-test technology, this paper puts forward some ideas and ways for applying the selfdiagnosis and self-test technology to complicated control system.
出处 《机电产品开发与创新》 2006年第2期118-120,130,共4页 Development & Innovation of Machinery & Electrical Products
基金 广东省科技工业攻关项目(2005B10201022 2005B16001159和2004B10201011)
关键词 自诊断自测试 故障诊断 控制系统 Self-diagnosis and self-test Fault diagnosis Control system
  • 相关文献

参考文献10

  • 1Baudry,B.; Traon,Y.L.; Sunye,G.; Jezequel,J.-M.Measuring and improving design patterns testability[J].Software Metrics Symposium,2003.Proceedings.Ninth International,3~5 Sept.2003 Pages:50~59.
  • 2刘国光.自诊断技术在智能化仪表中的应用[J].自动化与仪器仪表,2000(6):27-28. 被引量:4
  • 3陶建武,王树忠,焉晓东,石要武.交流电源实时测试系统[J].仪器仪表学报,2002,23(z1):109-110. 被引量:1
  • 4钮永胜,赵新民,孙金玮.传感器故障诊断方法研究[J].航天控制,1996,14(4):47-49. 被引量:7
  • 5On-line diagnosis of incipient faults and cellulose degradation based on artificial intelligence methods.Izzularab,M.A.; Aly,G.E.M.;Mansour,D.A.;Solid Dielectrics,2004.ICSD 2004.Proceedings of the 2004 IEEE International Conference on,Vol.2,5~9 July 2004 Pages:767~770.
  • 6Mehrdad Saif,et al.Sliding Mode Observers and Their Application in Fault Diagnosis[J].Fault Diagnosis and Fault Tolerance for Mechatronic Systems.2003,(1):1~57.
  • 7王德合,尹光.数字电路板故障诊断探讨[J].电子工程师,2001,27(1):45-46. 被引量:2
  • 8于云华,石寅.数字集成电路故障测试策略和技术的研究进展[J].电路与系统学报,2004,9(3):83-91. 被引量:16
  • 9Carolina Selva,Cosimo Torelli,Danilo Rimondi,and etc..A Programmable Built-In Self-Diagnosis[J].2004 IEEE MDTD'04.
  • 10C.J.Clark,Mike Ricchett.Infrastructure IP for Configuration and Test of Boards and Systems[J].IEEE Design & Test of Computers,May-June 2003.

二级参考文献21

  • 1周慈航.单片机应用程序设计技术[M].北京:北京航空航天大学出版社,1991..
  • 2Bardell P, McAnney W. Built-in Test for VLSI, Pseudorandom Techniques [M]. New York: Wiley, 1987.
  • 3Bennetts R. Design of Testable Logic Circuits [M]. MA: Addison-Wesley, 1984.
  • 4Nagle H. Design for testability and built-in self-test: a review [J]. IEEE Trans. on Industrial Electronics, 1989, 36 (2): 129-140.
  • 5Maunder C. The Test Access Port and Boundary Scan Architecture [M]. CA: IEEE Computer Society Press, 1992.
  • 6Steininger A. Testing and built-in self-test-A survey [J]. Journal of Systems Architecture, 2000, 46: 721-747.
  • 7Amerasekera E, Najm F. Failure Mechanisms in Semiconductor Devices.2nd [M]. New York: Wiley, 1997.
  • 8Fritzemeier R, Nagle H. Fundamentals of testability-tutorial [J]. IEEE Trans. on Industrial Electronics, 1989, 36 (2): 117-128.
  • 9Goldstein L. Controllability/Observability Analysis Program [A]. IEEE Design Automation Conf. [C]. 1980-06, 190-196.
  • 10Eichelberger E. Structured Logic Testing [M]. Englewood Cliffs , NJ: Prentice Hall, 1991.

共引文献25

同被引文献4

引证文献1

二级引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部