摘要
用X光结构分析,电子显微镜(SEM)和高分辨率透射电镜(TEM)观察及电、磁测量等手段,系统地研究了烧结YBa_2Cu_3O_x超导体的制备工艺、显微结构与临界电流密度之间的关系,通过讨论分析。
The relationships among the conditions of preparation , the microstructure and the critical current density of sintered YBa:Cu3Ox superconductors were studied by X - ray diffraction , SEM , TEM and electrical as well as magnetic means of experimentation . Three kinds of grain boundaries are considered responsible for the detected low Jc in sintered samples .
出处
《北京理工大学学报》
EI
CAS
CSCD
1990年第4期52-58,共7页
Transactions of Beijing Institute of Technology
关键词
超导体
临界电流
显微结构
superconductor , critical current , microstructure , grain boundary
