摘要
叙述了同步辐射白光全反射Ｘ射线荧光分析的实验装置，给出了几种标准物质ＴＸＲＦ实验的检出限，并对实验结果进行了讨论。
The experimental facility for total reflection X-ray fluorescence analysis with white synchrotron radiation is described.The minimum detection limits for several standard materials and samples have been obtained.The experimental results are discussed.
出处
《分析测试学报》
CAS
CSCD
1996年第1期6-11,共6页
Journal of Instrumental Analysis
关键词
同步辐射
全反射
X射线荧光分析
痕量分析
Synchrotron radiation,Total reflection,X-ray fluorescence analysis,Trace element analysis.
