摘要
测定金刚石结构薄层晶体的喇曼散射光极值法被推广到测定闪锌矿结构薄层晶体的晶向。导出了闪锌矿结构晶体LO和TO声子的喇曼散射光强和晶体的方位及入射光偏振方向间的函数关系。由函数的极值可以确定簿层的晶向。对GaP晶片比较了本方法得到的结果和X射线衍射法得到的结果。
The Raman Scattering Extrema Method proposed by the authors to determine the orientationof a thin layer crystal with diamond structure is extended to the zincblende structure. TheRaman scattering intensities of LO and TO phonons for a zincblende-stuctured thin layer asfunctions of both the orientation of this layer and the polarization direction of the incidentlight have been derived.The orientation of the layer is determined by means of the extremaof these functions For GaP wafers, the result obta(?)ned by using this method is compared withthat determined by the X-ray method.
关键词
锌矿
晶体
晶向
喇曼散射
光极值
Raman Scattering
zincblende structure
thin crystal layer
Orientation
