摘要
非均匀性是红外系统中影响图像质量的重要因素。为了更好地拟合探测器的响应曲线,充分发挥探测器的最佳性能,以获得良好的图像效果,在两点校正的理论基础上提出了一种更为实用的两点校正方法。通过单片机(MCU)控制半导体制冷器(TEC)以产生两个不同的校正温度点,系统分别读取在这两个温度点下所采集的两幅图像,利用两点校正算法计算探测器的响应率和暗电流。通过实验验证,这种校正算法实用,易于实现。
Non-uniformity is the main factor which affects images quality in infrared system. In order to get better video image effects and optimize the detector performance, according to two-point correction theory, a new method to realize two-point non-uniformity correction based on TEC is put up. Under control order from MCU, TEC produces two different temperature points at different time. This means two different infrared images are born. Using these two images we can calculate response rate and dark current by means of two-point correction.. The arithmetic and structure of the method are simple, and the method can be easily realized.
出处
《光学与光电技术》
2005年第6期9-11,共3页
Optics & Optoelectronic Technology
