摘要
提出了偏转物体实现电子散斑干涉(ESPI)条纹调制的新方法。当物体有微小偏转时可形成等间距的干涉条纹,从而形成载波条纹。物体加载后,该条纹受物体变形的调制而发生弯曲变形。采集物体变形前后的条纹,利用Fourier变换法,可解调出变形场的位相,从而实现物体变形场的精确测量。对偏转物体方法的调制机理进行了理论分析,并利用中心加载周边固定圆盘进行了典型实验。结果表明,该方法能够高质量地调制ESPI场,求解位移场。
A new modulating method for electronic speckle patterns interferometry（ESPI） is presented. When the test object is tilted a small angle,a series of parallel interference fringes are formed. Then,carrier fringes are introduced. While the object is loaded,the carrier will be curved due to the modulation of deformation of the object surface. With the carrier and the modulated carrier, the phase correlated with deformation of object can be derived by Fourier transform. Then the displacement field can be obtained exactly. The principle of the tilted-object method is presented. A typical experiment using a centrally loaded clamped circular plate is completed. The theoretic analysis and the experimental results prove that the tilted-object method can modulate speckle pattern very well and the displacement fields can be obtained effectively.
出处
《光电子．激光》
EI
CAS
CSCD
北大核心
2005年第9期1093-1096,共4页
Journal of Optoelectronics·Laser
基金
山东省教育厅科技计划资助项目(01901)
关键词
电子散斑干涉(ESPI)
调制
解调
变形场
electronic speckle pattern interferometry（ESPI）； modulation ； demodulation
displacement field
