摘要
采用单光束Z扫描方法,对4mm厚Nd∶YVO4晶体的非线性折射率进行了测量。采用薄样品理论对测量数据进行计算处理,所得出的结果与其他不同方法测得的结果相吻合.由此证明这种简单的测量和处理方法的合理性和有效性.
In this measurement of the nonlinear refraction index of 4mm thick Nd ： YVO4 crystal, the single-beam Z scan method is employed and the experimental data is processed according to the Z scan theory of thin sample. As a result, the refraction index, which tallies with the one resulting from other different measure method, is obtained in this measurement. So the rationality and the validity of this simple measurement and data processing method are proved.
出处
《光子学报》
EI
CAS
CSCD
北大核心
2005年第8期1172-1175,共4页
Acta Photonica Sinica
