摘要
本文介绍微处理器功能测试系统MFTS的总体结构和工作原理,该系统采用一种无故障模型,测试序列灵活多变,因而故障覆盖率也是可变的,非确定性功能测试方法。
This paper introduces the architectures and working principle of the functional test system of microprocessors(MFTS). The system uses a unddtermined functional test method in which there is no fault models and both test sequence and fault coverage are changeable The method is based on the reliability of micro-operations which perform the instruction functions of a microprocessor. It may produces the different test sequence for user's requirements or for the properties of tested objects. Research work on MFTS is successful now.
出处
《微电子学与计算机》
CSCD
北大核心
1989年第6期43-46,共4页
Microelectronics & Computer
