摘要
基于集成电路成品率极大中心设计，最佳容差设计，最佳调整设计和生产费用极小化设计的一体化模型（ＤＣＴＴ模型），该文给出了函数序列凸化下求解ＤＣＴＴ的有效方法。该方法应用确定性方法和正交最优化方法相结合，将容差域的２￣ｎ个顶点离散为ｎ＋１个约束条件，并利用不可微规划直接得到ＤＣＴＴ问题的最优解。该方法较好地解决了较大规模的集成电路统计最优化问题。
Based on the unitized model of design centering for maximum manufacturingyield,optimal toleraneing design, optimal tuning design and design of minimizedmanufacturing costs of integration,an efficient method of solving DCTT is givenunder the conditions of sequential convexity of functions in this paper. Themethod combines the deterministic optimization technique with the orthogonaloptimal experiment method to change the 2￣n vertices of the tolerance region into(n+1)constraint conditions,and uses nondifferentiable optimization to solve theDCTT problem directly. Therefore,the method can solve large scale IC statisticaloptimization problems.
出处
《应用科学学报》
CAS
CSCD
1994年第2期133-139,共7页
Journal of Applied Sciences
关键词
集成电路
DCTT模型
统计最优化法
integrated circuits,optimization techniques, statistical programming.
