摘要
用谐振腔法无损测定两种进口带线基片成品的复介电系数.本工作的特点是用若干已知介电系数的材料,制作成形状、尺寸与待测基片一样的标准样片,将待测基片与样片引起的不同频差看作为介电系数微扰,用插值法求得待测基片的介电系数.
The complex permittivities of two manufactured stripline substractes were measured using cavity perturbation technique. With the help of several geometrically identical samples, of which the dielectrical constant are known, the dielectrical constant of the substrate under test can be calculated by interpolation method.
出处
《微波学报》
CSCD
北大核心
1994年第3期51-53,共3页
Journal of Microwaves
关键词
复介电系数
无损测量
谐振腔
带线茎片
Complex permittivity. Nondestructive measurement . Cavity
