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和型莫尔偏折术的探讨

On an Additive Type of Moire Deflectometry
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摘要 探讨了一种和型莫尔偏折术.将两组周期相同的干涉条纹同时投射到接收面上,让光强相加而得到莫尔条纹.分析了其原理,并用计算机进行了模拟. An additive type of Moire deflectometry for measuring the phase of an object is suggest-ed. When two sets of interference fringes are projected together on a receiver,their intensi-ties are superimposed by addition and Moire fringes are generated.Moire fringes will be de-flected if a phase object is put into one of two interference fields. The equation for the addi-tive type Moire fringe is described and the Moire patterns are simulated with a computer.
出处 《华中理工大学学报》 CSCD 北大核心 1994年第4期101-104,共4页 Journal of Huazhong University of Science and Technology
关键词 莫尔条纹 莫尔偏折术 光学 干涉 interference Moire fringe Moire deflectometry
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