摘要
对于已知部件失效分布和试验数据的并-串联系统,本文应用经典法和Bayes法分别给出了其可靠性置信下限值,其结果彼此接近。
Using the confidence interval and Bayes methods, this paper deals with the lower confidence bound on reliability of the series-parallel system whose part failure distribution and test data are known. The results are very close to each other.
出处
《系统工程与电子技术》
EI
CSCD
1993年第2期76-80,F003,共6页
Systems Engineering and Electronics
关键词
系统可靠性
可靠性
评价
近似解
Reliability function, Classic approximate bounds, Bayes approximate bounds.
