摘要
优质和大截面的KDP单晶,利用实验室常规的Lang貌术,一般检测不到任何层状分布的衍射衬度。本文叙述应用双晶衍射的(n,-n)几何排列对弱生长层及其相应的点阵参数相对变化的测量结果。从一对(100)晶片的(600)晶面的对称反射双晶形貌图证实,呈弱而弥散的层状衬度分布是垂直于 c 轴向的弱生长层,而生长层的点阵参数相对变化的最大范围为0.2～4.5×10~5。
In situ measurements on the relative changes in the latticeconstants of KDP corresponding to the weak growth layers,which are notdetectable by the conventional X-ray diffraction topography,has beencarried out by means of(n,-n)double crystal diffractometry.A couple ofspecimens of(100)crystal plates was cut from the(100)nature face of acrystal with large size and higher quality.The specimens were then polishedchemically to remove mechanical damages.The(n,-n)double crystal X-rayreflection topography of the(600)plane taken with CuKα_1 radiation shows thatthere exist some weaker and dispersed growth layers perpendicular to the caxis.The relative changes in lattic constants due to weaker growth layesare in the range 0.2 to 4.5×10^(-5)
出处
《人工晶体学报》
EI
CAS
CSCD
1989年第2期165-165,共1页
Journal of Synthetic Crystals
