摘要
本文对近年来国内外学者在时序电路测试生成方面的研究成果进行了综述,对其做了比较、分析, 并在前人研究的基础上提出一种时序电路的测试生成方法。
Several effective ATPG algorithms for sequential circuits are analyzed and compared in this paper, and a new algorithm based on the previous work is proposed, which could be proved to be effective theoretically.
出处
《电子质量》
2004年第9期6-8,共3页
Electronics Quality
关键词
路测
时序电路
测试生成算法
Test generation
fault simulation
state justify
