摘要
本文讨论了HgCdTe晶体缺陷的两种快速X射线形貌检测方法:使用X射线像眼的反射形貌法和反射Laue形貌法。在Laue形貌相机上用X射线像眼,经数分钟的曝光时间可拍摄分辨率约50μm的HgCdTe样品的反射扫描形貌相,而用特制的Laue相机可用20min的曝光时间拍得分辨率约60μm的反射形貌相。
The two testing methods of X-ray topography for HgCdTe crystal defects are studied in this paper——one is the scanning reflective topography with an X-ray image eye and the other is reflective Laue topography. A scanning reflective topography of HgCdTe sample with a resolution of 50μm can be taken in a few minutes exposure to an X-ray image eye; while a reflective topography with a resolution of 60μm can be taken in 20 minutes exposure to a specific laue camera.
出处
《红外技术》
CSCD
1993年第3期19-22,共4页
Infrared Technology
