摘要
对于高分辨率表面观察,人们通常利用扫描电子显微镜(SEM)和原子力显微镜(AFM),特别是当分辨率在纳米和原子范围时,SEM和AFM是我们今天可以获得的最有效的两种显微技术。然而,任何一种仪器都不是万能的。本文就材料的表面结构、成分和环境对两种技术进行比较,并描述它们各自独立的特点和互补性。
For high-resolution surface investigations,two commonly used techniques are Scanning Electron Microscopy(SEM)and Atomic Force Microscopy(AFM).Especially for the resolution in nanometer and angstrom ranges,both SEM and AFM are the most powerful microscopy technique available today.However,no one instrument is all-round.In this paper,these two techniques are compared with respect to the surface structure and composition of materials and environment,which demonstrate how these analytical techniques provide the information being complementary in nature.
出处
《矿冶》
CAS
2004年第3期95-97,79,共4页
Mining And Metallurgy
