期刊文献+

模糊神经网络在电子器件微波易损性评估中的应用 被引量:13

Applications of fuzzy neural network to susceptibility assessments of electronic devices illuminated or injected by microwaves
在线阅读 下载PDF
导出
摘要  应用模糊神经网络预测了电子器件失效阈值随高功率微波参数的变化关系。结合电子器件实验数据较少的情况,提出用可能性理论估计器件失效可能性分布的评估方法;结合模糊神经网络的学习预测能力,得到电子器件失效的可能性分布;并将可能性分布和用信息扩散估计方法得到的概率分布进行了比较,前者能够更好地利用实验数据估计器件失效的可能性。 In this paper, the fuzzy neural network is applied to evaluate the failure thresholds of electronic devices as a function of the parameters of the high power microwave. Based on the characteristic of experimental data, this paper presents a method to evaluate the possibility distribution of electronic device failure applying the possibility theory. Combining the possibility theory and prediction ability of the fuzzy neural network ,the possibility distribution of electronic device failure can be obtained.
出处 《强激光与粒子束》 EI CAS CSCD 北大核心 2004年第7期909-914,共6页 High Power Laser and Particle Beams
基金 国家863计划项目资助课题
关键词 模糊神经网络 高功率微波 可能性理论 易损性评估 Fuzzy neural network High power microwave Possibility theory Susceptibility assessment
  • 相关文献

参考文献4

  • 1[1]Bevensee R M, Cabayan H S, Deadrick F J et al. Probabilistic Approach to EMP Assessment[R]. UCRL-52804,1979.
  • 2[2]Mensing R W. Application of PRA to HEMP vulnerability analysis[R]. UCID-20553,1985.
  • 3[3]Mensing R W, King R J, Cabayan H S. A method for estimating the susceptibility of electronic system to HPM[R]. UCID-21430,1988.
  • 4[8]Zadeh L A. Fuzzy sets as a base for a theory of possibility[J].Fuzzy Sets and Systems, 1978, (1):3-28.

同被引文献123

引证文献13

二级引证文献81

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部