This paper presents a standard scalable and reconfigurable design for testability (SR DfT) in order to increase ac- cessibility to deeply embedded A/MS cores and to limit application of costly off-chip mixed-signal te...This paper presents a standard scalable and reconfigurable design for testability (SR DfT) in order to increase ac- cessibility to deeply embedded A/MS cores and to limit application of costly off-chip mixed-signal testers. SR DfT is an oscilla- tion-based wrapper compatible with digital embedded core-based SoC test methodologies. The impact of the optimized oscilla- tion-based wrapper design on MS SoC testing is evaluated in two directions: area and test time. Experimental results are presented for several SoCs from the ITC’02 test benchmarks with inclusion of eight analog filters.展开更多
文摘This paper presents a standard scalable and reconfigurable design for testability (SR DfT) in order to increase ac- cessibility to deeply embedded A/MS cores and to limit application of costly off-chip mixed-signal testers. SR DfT is an oscilla- tion-based wrapper compatible with digital embedded core-based SoC test methodologies. The impact of the optimized oscilla- tion-based wrapper design on MS SoC testing is evaluated in two directions: area and test time. Experimental results are presented for several SoCs from the ITC’02 test benchmarks with inclusion of eight analog filters.
