The electromigration induced microstructure evolution and damage in asymmetric Cu/Sn-58Bi/Cu solder interconnects were investigated by in-situ SEM observation, focused ion beam （FIB） microanalysis and finite element...The electromigration induced microstructure evolution and damage in asymmetric Cu/Sn-58Bi/Cu solder interconnects were investigated by in-situ SEM observation, focused ion beam （FIB） microanalysis and finite element （FE） simulation. The SEM results show that the electromigration-induced local degradation of microstructures, i.e., segregation of Bi-rich phase and formation of microcracks, in the asymmetric solder interconnects is much severer than that in the symmetrical ones. FIB-SEM microanalysis reveals that the microregional heterogeneity in electrical resistance along different electron flowing paths is the key factor leading to non-uniform current distribution and the resultant electromigration damage. Theoretical analysis and FE simulation results manifest that the current crowding easily occurs at the local part with smaller resistance in an asymmetric solder interconnect. All results indicate that the asymmetric shape of the solder interconnect brings about the difference of the electrical resistance between the different microregions and further results in the severe electromigration damage.展开更多
Clear experimental evidence for phase transitions was shown in titanium doped lead magnesium niobate compositional disordered ferroelectric ceramics. One is the diffused phase transition around the temperature of diel...Clear experimental evidence for phase transitions was shown in titanium doped lead magnesium niobate compositional disordered ferroelectric ceramics. One is the diffused phase transition around the temperature of dielectric permittivity maxima, which is often assumed as the characteristics of relaxor ferroelectrics. Another is a first order transition from frequency dispersion relaxor ferroelectrics to normal ferroelectrics, corresponding to a zero field spontaneous polar micro macrodomain switching. According to the x ray diffraction, thermal analysis and transmission electron microscope results, it is pointed out that the relaxor state corresponds to a coexistence of cubic parent phase and nucleating rhombohedral ferroelectric microregion which is similar to a precursor martensite. After the spontaneous relaxor normal ferroelectrics transition, the lower symmetry phase is sure to be a long range rhombohedral phase. Thus a dynamic behavior of polar microregions is suggested to explain the phenomena, which is more similar to a stress induced martensitic transformations from cubical stabilized perovskite parent phase.展开更多
基金Project(51275178)supported by the National Natural Science Foundation of ChinaProject(20110172110003)supported by ResearchFund for the Program of Higher Education of China
文摘The electromigration induced microstructure evolution and damage in asymmetric Cu/Sn-58Bi/Cu solder interconnects were investigated by in-situ SEM observation, focused ion beam （FIB） microanalysis and finite element （FE） simulation. The SEM results show that the electromigration-induced local degradation of microstructures, i.e., segregation of Bi-rich phase and formation of microcracks, in the asymmetric solder interconnects is much severer than that in the symmetrical ones. FIB-SEM microanalysis reveals that the microregional heterogeneity in electrical resistance along different electron flowing paths is the key factor leading to non-uniform current distribution and the resultant electromigration damage. Theoretical analysis and FE simulation results manifest that the current crowding easily occurs at the local part with smaller resistance in an asymmetric solder interconnect. All results indicate that the asymmetric shape of the solder interconnect brings about the difference of the electrical resistance between the different microregions and further results in the severe electromigration damage.
文摘Clear experimental evidence for phase transitions was shown in titanium doped lead magnesium niobate compositional disordered ferroelectric ceramics. One is the diffused phase transition around the temperature of dielectric permittivity maxima, which is often assumed as the characteristics of relaxor ferroelectrics. Another is a first order transition from frequency dispersion relaxor ferroelectrics to normal ferroelectrics, corresponding to a zero field spontaneous polar micro macrodomain switching. According to the x ray diffraction, thermal analysis and transmission electron microscope results, it is pointed out that the relaxor state corresponds to a coexistence of cubic parent phase and nucleating rhombohedral ferroelectric microregion which is similar to a precursor martensite. After the spontaneous relaxor normal ferroelectrics transition, the lower symmetry phase is sure to be a long range rhombohedral phase. Thus a dynamic behavior of polar microregions is suggested to explain the phenomena, which is more similar to a stress induced martensitic transformations from cubical stabilized perovskite parent phase.
