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Case studies of ion focusing in the downstream region of a modeled low Earth orbit spacecraft
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作者 Nizam Ahmad Hideyuki Usui +4 位作者 Yohei Miyake Slamet Supriadi Hanif Fakhrurroja Hilman Syaeful Alam Harry Bangkit 《Earth and Planetary Physics》 2026年第1期136-143,共8页
The effect of plasma and charged particle interaction with spacecraft in a low Earth orbit(LEO)environment leads to ion focusing and the formation of an ion void in the downstream region as a result of charging.Simula... The effect of plasma and charged particle interaction with spacecraft in a low Earth orbit(LEO)environment leads to ion focusing and the formation of an ion void in the downstream region as a result of charging.Simulations and investigations using a fixed potential imposed on the spacecraft showed the nonsignificance of geophysical parameter changes to ion focusing.Variation of the temperature ratio(T_(r))contributed only to local ion focusing and manifested as two-ion streamers dispersed at the upper and lower edges of the spacecraft-the outermost layers of the satellite structure at the top and bottom,respectively.A simulation involving changing the ambient plasma density(N_(p))also showed the formation of local ion focusing,in which ions were more concentrated as the density increased.Furthermore,auroral electron density(N_(ae))variation had no clear impact on ion focusing,as indicated by static two-ion structures in the wake field.However,variation of the object potential(ϕ)strongly affected ion focusing formation,leading to distortion of the initial ion void region behind the spacecraft.The formation of ion focusing in this study was subject to the electric field produced by the object potential and the ambipolar electric field resulting from plasma expansion in the downstream region. 展开更多
关键词 ion focusing spacecraft potential low Earth orbit environment
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Effects of helium ion irradiation and thermal annealing on the optical and structural properties of hexagonal boron nitride
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作者 Guan-Lin Liu Ji-Lian Xu +13 位作者 Peng-Tao Jing Jing-Jing Shao Xu Guo Yun-Tao Wu Feng Qin Zhen Cheng Deming Liu Yang Bao Hai Xu Li-Gong Zhang Da Zhan Jia-Xu Yan Lei Liu De-Zhen Shen 《Chinese Physics B》 2025年第5期578-586,共9页
Hexagonal boron nitride(h-BN)has emerged as a promising two-dimensional material for quantum and optoelectronic applications,with its unique ability to host engineered defects enabling single-photon emission and spin ... Hexagonal boron nitride(h-BN)has emerged as a promising two-dimensional material for quantum and optoelectronic applications,with its unique ability to host engineered defects enabling single-photon emission and spin manipulation.This study investigates defect formation in h-BN using focused helium ion beam(He^(+)FIB)irradiation and post-annealing treatments.We demonstrate that helium ion irradiation at doses up to 2×10^(9) ions/μm^(2) does not induce phase transitions or amorphization.Spectroscopic analyses,including differential reflectance spectroscopy(DRS),photoluminescence(PL),and Raman spectroscopy,reveal substantial defect formation and structural modifications.Notably,the irradiation induces a softening of in-plane and interlayer phonon modes,characterized by frequency redshifts of 10.5 cm^(-1) and 3.2 cm^(-1),respectively.While high-temperature thermal annealing mitigates lattice defects and facilitates single-photon emission,the E_(2g) peak width remains 38%broader and the shear mode peak width is 60%broader compared to pre-annealing conditions in the Raman spectra,indicating residual structural degradation.These findings provide insights into defect engineering mechanisms in h-BN,offering guidance for optimizing processing conditions and advancing quantum and optoelectronic device technologies. 展开更多
关键词 hexagonal boron nitride focused ion beam defect engineering quantum materials SPECTROSCOPY
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Fabrication of Windowed Very-Small-Aperture Laser Diodes
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作者 康香宁 徐云 +2 位作者 宋国峰 叶晓军 陈良惠 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2003年第11期1145-1148,共4页
A windowed very small aperture laser (VSAL) source for use in high resolution near field optical data storage is fabricated.The windowed regions are introduced to avoid shorting the pn junction with metal coating a... A windowed very small aperture laser (VSAL) source for use in high resolution near field optical data storage is fabricated.The windowed regions are introduced to avoid shorting the pn junction with metal coating and suppress the COD effect.It facilitates producing VSAL by simplified technology and improves the laser performance.A VSAL with 400nm small aperture is demonstrated by focused ion beam (FIB) and the output power is 0 3mW at 31mA. 展开更多
关键词 very small aperture laser optical near field ridge waveguide focused ion beam
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A Reflectron Time-of-Flight Mass Spectrometer with a Nano-Electrospray Ionization Source for Study of Metal Cluster Compounds
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作者 吴小虎 谢华 +3 位作者 刘志凌 苏海峰 林水潮 唐紫超 《Chinese Journal of Chemical Physics》 SCIE CAS CSCD 2016年第4期401-406,I0001,共7页
An experiment facility has been set up for the study of metal cluster compounds in our laboratory, which consists of a nano-electrospray ionization source, an ion transmission and focus system, and a reflectron time-o... An experiment facility has been set up for the study of metal cluster compounds in our laboratory, which consists of a nano-electrospray ionization source, an ion transmission and focus system, and a reflectron time-of-fight mass spectrometer. Taking advantage of the nano-electrospray ionization source, polyvalent ions are usually produced in the "ionization" process and the obtained mass resolution of the equipment is over 8000. The molecular ion peaks of metal cluster compounds [Au20(PPhpy2)10Cl2](SbF6)4, where PPhpy2=bis(2- pyridyl)phenylphosphine, and [AuaAg2(C)L6](BF4)4, where L=2-(diphenylphosphino)-5- methylpyridine, are distinguished in the respective mass spectrum, accompanied by some fragment ion peaks. In addition, the mass-to-charge ratios of the parent ions are determi- nated. Preliminary results suggest that the device is a powerful tool for the study of metal cluster compounds. It turns out that the information obtained by the instrumentation serves as an essential supplement to single crystal X-ray diffraction for structure characterization of metal cluster compounds. 展开更多
关键词 Nano-electrospray ionization source ion transmission and focus system Reflectron time-of-flight mass spectrometer Metal cluster compounds Single crystal X-ray diffraction
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Effects of operating conditions on the performance degradation and anode microstructure evolution of anode-supported solid oxide fuel cells 被引量:5
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作者 Xin Yang Zhihong Du +5 位作者 Qian Zhang Zewei Lyu Shixue Liu Zhijing Liu Minfang Han Hailei Zhao 《International Journal of Minerals,Metallurgy and Materials》 SCIE EI CAS CSCD 2023年第6期1181-1189,共9页
Performance degradation shortens the life of solid oxide fuel cells in practical applications.Revealing the degradation mechanism is crucial for the continuous improvement of cell durability.In this work,the effects o... Performance degradation shortens the life of solid oxide fuel cells in practical applications.Revealing the degradation mechanism is crucial for the continuous improvement of cell durability.In this work,the effects of cell operating conditions on the terminal voltage and anode microstructure of a Ni-yttria-stabilized zirconia anode-supported single cell were investigated.The microstructure of the anode active area near the electrolyte was characterized by laser optical microscopy and focused ion beam-scanning electron microscopy.Ni depletion at the anode/electrolyte interface region was observed after 100 h discharge tests.In addition,the long-term stability of the single cell was evaluated at 700℃for 3000 h.After an initial decline,the anode-supported single cell exhibits good durability with a voltage decay rate of 0.72%/kh and an electrode polarization resistance decay rate of 0.17%/kh.The main performance loss of the cell originates from the initial degradation. 展开更多
关键词 solid oxide fuel cell Ni-YSZ anode focused ion beam Ni migration electrochemical performance
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Characterization of 3D pore nanostructure and stress-dependent permeability of organic-rich shales in northern Guizhou Depression,China 被引量:7
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作者 Xiaofang Jiang Shouchun Deng +1 位作者 Haibo Li Hong Zuo 《Journal of Rock Mechanics and Geotechnical Engineering》 SCIE CSCD 2022年第2期407-422,共16页
The three-dimensional(3D)pore structures and permeability of shale are critical for forecasting gas production capacity and guiding pressure differential control in practical reservoir extraction.However,few investiga... The three-dimensional(3D)pore structures and permeability of shale are critical for forecasting gas production capacity and guiding pressure differential control in practical reservoir extraction.However,few investigations have analyzed the effects of microscopic organic matter(OM)morphology and 3D pore nanostructures on the stress sensitivity,which are precisely the most unique and controlling factors of reservoir quality in shales.In this study,ultra-high nanoscale-resolution imaging experiments,i.e.focused ion beam-scanning electron microscopy(FIB-SEMs),were conducted on two organic-rich shale samples from Longmaxi and Wufeng Formations in northern Guizhou Depression,China.Pore morphology,porosity of 3D pore nanostructures,pore size distribution,and connectivity of the six selected regions of interest(including clump-shaped OMs,interstitial OMs,framboidal pyrite,and microfractures)were qualitatively and quantitatively characterized.Pulse decay permeability(PDP)measurement was used to investigate the variation patterns of stress-dependent permeability and stress sensitivity of shales under different confining pressures and pore pressures,and the results were then used to calculate the Biot coefficients for the two shale formations.The results showed that the samples have high OM porosity and 85%of the OM pores have the radius of less than 40 nm.The OM morphology and pore structure characteristics of the Longmaxi and Wufeng Formations were distinctly different.In particular,the OM in the Wufeng Formation samples developed some OM pores with radius larger than500 nm,which significantly improved the connectivity.The macroscopic permeability strongly depends on the permeability of OM pores.The stress sensitivity of permeability of Wufeng Formation was significantly lower than that of Longmaxi Formation,due to the differences in OM morphology and pore structures.The Biot coefficients of 0.729 and 0.697 were obtained for the Longmaxi and Wufeng Formations,respectively. 展开更多
关键词 Focused ion beam scanning electron microscopy(FIB-SEM) Three-dimensional(3D)reconstruction Pulse decay permeability(PDP) Stress sensitivity Wufeng-Longmaxi formation
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Imaging the interphase of carbon fiber composites using transmission electron microscopy:Preparations by focused ion beam, ion beam etching, and ultramicrotomy 被引量:3
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作者 Wu Qing Li Min +2 位作者 Gu Yizhuo Wang Shaokai Zhang Zuoguang 《Chinese Journal of Aeronautics》 SCIE EI CAS CSCD 2015年第5期1529-1538,共10页
Three sample preparation techniques, focused ion beam (FIB), ion beam (IB) etching, and ultramicrotomy (UM) were used in comparison to analyze the interphase of carbon fiber 'epoxy composites using transmission... Three sample preparation techniques, focused ion beam (FIB), ion beam (IB) etching, and ultramicrotomy (UM) were used in comparison to analyze the interphase of carbon fiber 'epoxy composites using transmission electron microscopy. An intact interphase with a relatively uniform thickness was obtained by FIB. and detailed chemical analysis of the interphase was investigated by electron energy loss spectroscopy. It shows that the interphase region is 200 mn wide with an increasing oxygen-to-carbon ratio from 10% to 19% and an almost constant nitrogen-to-carbon ratio of about 3%. However, gallium implantation of FIB tends to hinder fine structure analysis of the interphase. For IB etching, the interphase region is observed with transition morphology frona amorphous resin to nano-crystalline carbon fiber, but the uneven sample thickness brings difficulty for quantitative chemical analysis. Moreover, UM tends to cause damage and/or deformation on the interphase. These results are meaningful for in-depth understanding on the interphase characteristic of carbon fiber composites. 展开更多
关键词 Carbon fiber compositeChemical analysis Focused ion beams lnterphase ion beam etching MICROSTRUCTURE Ultramicrotomy
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Annealing treatment of focused gallium ion beam processing of SERS gold substrate 被引量:3
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作者 Zhixiang Tao Wei Zhao +4 位作者 Shang Wang Boyu Zhao Rushuai Hua Ji Qin Zongwei Xu 《Nanotechnology and Precision Engineering》 CAS CSCD 2021年第4期37-44,共8页
Raman spectroscopy is a type of inelastic scattering spectroscopy that is widely used in determining and analyzing molecular structure.It also has a number of practical applications in evaluating food safety,medicine,... Raman spectroscopy is a type of inelastic scattering spectroscopy that is widely used in determining and analyzing molecular structure.It also has a number of practical applications in evaluating food safety,medicine,and forensics.The Raman spectral signal is weak,but the development of the surface-enhanced Raman scattering(SERS)technique has overcome this problem and led to further developments in Raman spectroscopy.This paper describes a fundamental study of the use of focused ion beam(FIB)direct writing for preparing gold substrates for SERS.Molecular dynamics and Monte Carlo simulation methods are used to investigate the damage induced by gallium ion implantation of a gold substrate.Based on characterization by x-ray photoelectron spectroscopy(XPS)and scanning electron microscopy,the mechanism by which ion implantation and annealing influence the damage induced by a gallium FIB is analyzed.After annealing at 350 XC,a mixture of metallic gallium,its oxide Ga2O3 conforming to the stoichiometric ratio,and its sub-stable oxide(Ga2Ox)in sub-stoichiometric ratio precipitated on the surface are detected by XPS.Annealing treatment can effectively reduce the effect of gallium ion implantation on a SERS substrate fabricated by FIB direct writing. 展开更多
关键词 Raman spectroscopy Focused ion beam ANNEALING X-ray photoelectron spectroscopy
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Quantitative two/three-dimensional spatial characterization and fluid transport prediction of macro/micropores in Gaomiaozi bentonite 被引量:2
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作者 Jiangfeng Liu Shijia Ma +3 位作者 Hongyang Ni Hai Pu Xiaozhao Li Shaojie Chen 《Journal of Rock Mechanics and Geotechnical Engineering》 SCIE CSCD 2022年第5期1568-1579,共12页
The sealing performance of a bentonite barrier is highly dependent on its seepage characteristics, which are directly related to the characteristics of its pore structure. Based on scanning electron microscopy(SEM) an... The sealing performance of a bentonite barrier is highly dependent on its seepage characteristics, which are directly related to the characteristics of its pore structure. Based on scanning electron microscopy(SEM) and focused ion beam-SEM(FIB-SEM), the pore structure of bentonite was characterized at different scales. First, a reasonable gray threshold was determined through back analysis, and the image was binarized based on the threshold. In addition, binary images were used to analyze bentonite’s pore structure(porosity and pore size distribution). Furthermore, the effects of different algorithms on the pore structure characterization were evaluated. Then, permeability calculations were performed based on the previous pore structure characteristics and a modified permeability prediction model. For permeability prediction based on the three-dimensional model, the effect of pore tortuosity was also considered. Finally, the accuracy of numerical calculations was verified by conducting macroscopic gas and alcohol permeability experiments. This approach provides a better understanding of the microscale mechanism of gas transport in bentonite and the importance of pore structures at different scales in determining its seepage characteristics. 展开更多
关键词 Gaomiaozi(GMZ)bentonite Pore structure Permeability prediction Focused ion beam-scanning electron microscopy(FIB-SEM)
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Influence of oxide scales on the corrosion behaviors of B510L hot-rolled steel strips 被引量:5
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作者 Cheng Man Chao-fang Dong +3 位作者 Hui-bin Xue Kui Xiao Xiao-gang Li Hui-bin Qi 《International Journal of Minerals,Metallurgy and Materials》 SCIE EI CAS CSCD 2016年第7期769-778,共10页
The influence of oxide scales on the corrosion behaviors of B510 L hot-rolled steel strips was investigated in this study. Focused ion beams and scanning electron microscopy were used to observe the morphologies of ox... The influence of oxide scales on the corrosion behaviors of B510 L hot-rolled steel strips was investigated in this study. Focused ion beams and scanning electron microscopy were used to observe the morphologies of oxide scales on the surface and cross sections of the hot-rolled steel. Raman spectroscopy and X-ray diffraction were used for the phase analysis of the oxide scales and corrosion products. The corrosion potential and impedance were measured by anodic polarization and electrochemical impedance spectroscopy. According to the results, oxide scales on the hot-rolled strips mainly comprise iron and iron oxides. The correlation between mass gain and test time follows a power exponential rule in the damp-heat test. The corrosion products are found to be mainly composed of γ-Fe OOH, Fe3O4, ?-Fe OOH, and γ-Fe2O3. The contents of the corrosion products are different on the surfaces of the steels with and without oxide scales. The steel with oxide scales is found to show a higher corrosion resistance and lower corrosion rate. 展开更多
关键词 strip steel hot rolling focused ion beams Raman spectroscopy oxide scale corrosion
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High-Temperature Superconducting YBa_(2)Cu_(3)O_(7-δ)Josephson Junction Fabricated with a Focused Helium Ion Beam 被引量:5
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作者 Ziwen Chen Yulong Li +9 位作者 Rui Zhu Jun Xu Tiequan Xu Dali Yin Xinwei Cai Yue Wang Jianming Lu Yan Zhang * and Ping Ma 《Chinese Physics Letters》 SCIE EI CAS CSCD 2022年第7期87-92,共6页
As a newly developed method for fabricating Josephson junctions,a focused helium ion beam has the advantage of producing reliable and reproducible junctions.We fabricated Josephson junctions with a focused helium ion ... As a newly developed method for fabricating Josephson junctions,a focused helium ion beam has the advantage of producing reliable and reproducible junctions.We fabricated Josephson junctions with a focused helium ion beam on our 50 nm YBa_(2)Cu_(3)O_(7-δ)(YBCO)thin films.We focused on the junction with irradiation doses ranging from 100 to 300 ions/nm and demonstrated that the junction barrier can be modulated by the ion dose and that within this dose range,the junctions behave like superconductor–normal conductor–superconductor junctions.The measurements of the I–V characteristics,Fraunhofer diffraction pattern,and Shapiro steps of the junctions clearly show AC and DC Josephson effects.Our findings demonstrate high reproducibility of junction fabrication using a focused helium ion beam and suggest that commercial devices based on this nanotechnology could operate at liquid nitrogen temperatures. 展开更多
关键词 Josephson Junction Fabricated with a Focused Helium ion Beam High-Temperature Superconducting YBa_(2)Cu_(3)O
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Co-doped BaFe_(2)As_(2) Josephson junction fabricated with a focused helium ion beam 被引量:2
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作者 陈紫雯 张焱 +6 位作者 马平 徐中堂 李宇龙 王越 路建明 马衍伟 甘子钊 《Chinese Physics B》 SCIE EI CAS CSCD 2024年第4期181-186,共6页
Josephson junction plays a key role not only in studying the basic physics of unconventional iron-based superconductors but also in realizing practical application of thin-film based devices,therefore the preparation ... Josephson junction plays a key role not only in studying the basic physics of unconventional iron-based superconductors but also in realizing practical application of thin-film based devices,therefore the preparation of high-quality iron pnictide Josephson junctions is of great importance.In this work,we have successfully fabricated Josephson junctions from Co-doped BaFe_(2)As_(2)thin films using a direct junction fabrication technique which utilizes high energy focused helium ion beam(FHIB).The electrical transport properties were investigated for junctions fabricated with various He^(+)irradiation doses.The junctions show sharp superconducting transition around 24 K with a narrow transition width of 2.5 K,and a dose correlated foot-structure resistance which corresponds to the effective tuning of junction properties by He^(+)irradiation.Significant J_c suppression by more than two orders of magnitude can be achieved by increasing the He^(+)irradiation dose,which is advantageous for the realization of low noise ion pnictide thin film devices.Clear Shapiro steps are observed under 10 GHz microwave irradiation.The above results demonstrate the successful fabrication of high quality and controllable Co-doped BaFe_(2)As_(2)Josephson junction with high reproducibility using the FHIB technique,laying the foundation for future investigating the mechanism of iron-based superconductors,and also the further implementation in various superconducting electronic devices. 展开更多
关键词 focused helium ion beam Co doped BaFe_(2)As_(2) Josephson junction
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Revealing substructure in clock-rolled Ta aided with triple focused ion beam
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作者 Shi-Feng Liu Xiao-Bo Hao +2 位作者 Chao Deng Hai-Yang Fan Qing Liu 《Rare Metals》 SCIE EI CAS CSCD 2017年第4期284-288,共5页
Clock rolling was developed to make defor- mation microstructure homogenize in high-purity Ta. The substructure of deformed Ta was revealed by electron back-scatter diffraction (EBSD) technique aided with triple foc... Clock rolling was developed to make defor- mation microstructure homogenize in high-purity Ta. The substructure of deformed Ta was revealed by electron back-scatter diffraction (EBSD) technique aided with triple focused ion beam (FIB). The results indicate that the triple FIB method can produce a mirror surface required by EBSD analysis. The clock rolling works well for the homogenization of deformed microstructure. Particularly, the local stored energy in { 111 } orientated grains is largely reduced by clock rolling, whereas it is enhanced in {100} orientated grains because of the occurrence of grain subdivision. 展开更多
关键词 Deformation SUBSTRUCTURE Strain pathchange Dislocation boundary Focused ion beam
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Ordered SrTiO_3 Nanoripples Induced by Focused Ion Beam
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作者 Jiang Wu Gang Chen +4 位作者 Zhaoquan Zeng Shibin Li Xingliang Xu Zhiming M.Wang Gregory J.Salamo 《Nano-Micro Letters》 SCIE EI CAS 2012年第4期243-246,共4页
Ordered nanoripples on the niobium-doped SrTiO_3 surfaces were fabricated through focused ion beam bombardment. The surface morphology of the SrTiO_3 nanoripples was characterized using in situ focused ion beam/scanni... Ordered nanoripples on the niobium-doped SrTiO_3 surfaces were fabricated through focused ion beam bombardment. The surface morphology of the SrTiO_3 nanoripples was characterized using in situ focused ion beam/scanning electron microscopy. The well-aligned SrTiO_3 nanostructures were obtained under optimized ion irradiation conditions. The characteristic wavelength was measured as about 210 nm for different ion beam currents. The relationship between the ion irradiation time and current and SrTiO_3 surface morphology was analyzed. The presented method will be an effective supplement for fabrication of SrTiO_3 nanostructures that can be used for ferroelectric and electronic applications. 展开更多
关键词 SRTIO3 focused ion beam nanoripple SELF-ASSEMBLY
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Degradation Diagnostics from the Subsurface of Lithium-Ion Battery Electrodes
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作者 Xuhui Yao Tomas Samoril +6 位作者 JiriDluhos John F.Watts Zhijia Du Bohang Song SRavi P.Silva Tan Sui Yunlong Zhao 《Energy & Environmental Materials》 SCIE EI CAS CSCD 2022年第2期662-669,共8页
Despite the long-established rocking-chair theory of lithium-ion batteries(LIBs),developing novel characterization methodology with higher spatiotemporal resolution facilitates a better understanding of the solid elec... Despite the long-established rocking-chair theory of lithium-ion batteries(LIBs),developing novel characterization methodology with higher spatiotemporal resolution facilitates a better understanding of the solid electrolyte interphase studies to shape the reaction mechanisms.In this work,we develop a Xenon ion plasma focused ion beam(Xe+PFIB)-based characterization technique to probe the cross-sectional interface of both ternary cathode and graphite anode electrodes,with the focus on revealing the chemical composition and distribution underneath the electrode surface by in-depth analysis of secondary ions.Particularly,the lithium fluoride is detected in the pristine cathode prior to contact with the electrolyte,reflecting that the electrode degradation is in the form of the loss of lithium inventory during electrode preparation.This degradation is related to the hydrolysis of the cathode material and the decomposition of the PVDF binder.Through the quantitative analysis of the transition-metal degradation products,manganese is found to be the dominant element in the newly formed inactive fluoride deposition on the cathode,while no transition metal signal can be found inside the anode electrode.These insights at high resolution implemented via a PFIB-based characterization technique not only enrich the understanding of the degradation mechanism in the LIBs but also identify and enable a high-sensitivity methodology to obtain the chemical survey at the subsurface,which will help remove the capacity-fade observed in most LIBs. 展开更多
关键词 DEGRADATion lithium-ion battery mass spectrometry plasma focused ion beam SUBSURFACE
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Lattice Boltzmann simulation study of anode degradation in solid oxide fuel cells during the initial aging process
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作者 Shixue Liu Zhijing Liu +1 位作者 Shuxing Zhang Hao Wu 《International Journal of Minerals,Metallurgy and Materials》 SCIE EI CAS CSCD 2024年第2期405-411,共7页
For present solid oxide fuel cells(SOFCs),rapid performance degradation is observed in the initial aging process,and the dis-cussion of the degradation mechanism necessitates quantitative analysis.Herein,focused ion b... For present solid oxide fuel cells(SOFCs),rapid performance degradation is observed in the initial aging process,and the dis-cussion of the degradation mechanism necessitates quantitative analysis.Herein,focused ion beam-scanning electron microscopy was em-ployed to characterize and reconstruct the ceramic microstructures of SOFC anodes.The lattice Boltzmann method(LBM)simulation of multiphysical and electrochemical processes in the reconstructed models was performed.Two samples collected from industrial-size cells were characterized,including a reduced reference cell and a cell with an initial aging process.Statistical parameters of the reconstructed microstructures revealed a significant decrease in the active triple-phase boundary and Ni connectivity in the aged cell compared with the reference cell.The LBM simulation revealed that activity degradation is dominant compared with microstructural degradation during the initial aging process,and the electrochemical reactions spread to the support layer in the aged cell.The microstructural and activity de-gradations are attributed to Ni migration and coarsening. 展开更多
关键词 solid oxide fuel cell anode degradation focused ion beam-scanning electron microscopy lattice Boltzmann method
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Half-integer Shapiro steps in MgB_(2) focused He ion beam Josephson junctions
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作者 殷大利 蔡欣炜 +5 位作者 徐铁权 孙瑞宁 韩颖 张焱 王越 甘子钊 《Chinese Physics B》 SCIE EI CAS CSCD 2024年第8期483-489,共7页
Half-integer microwave induced steps(Shapiro steps)have been observed in many different Josephson junction systems,which have attracted a lot of attention because they signify the deviation of current phase relation(C... Half-integer microwave induced steps(Shapiro steps)have been observed in many different Josephson junction systems,which have attracted a lot of attention because they signify the deviation of current phase relation(CPR)and uncover many unconventional physical properties.In this article,we first report the discovery of half-integer Shapiro steps in MgB_(2)focused He ion beam(He-FIB)Josephson junctions.The half-integer steps'dependence on microwave frequency,temperature,microwave power,and magnetic field is also analyzed.We find that the existence of half-integer steps can be controlled by the magnetic field periodically,which is similar to that of high temperature superconductor(HTS)grain boundary junctions,and the similarity of the microstructures between gain boundary junctions and He-FIB junctions is discussed.As a consequence,we mainly attribute the physical origin of half-integer steps in MgB_(2)He-FIB junctions to the model that a He-FIB junction is analogous to a parallel junctions'array.Our results show that He-FIB technology is a promising platform for researching CPR in junctions made of different superconductors. 展开更多
关键词 Josephson junction half-integer Shapiro steps MgB_(2) focused helium ion beam
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High resolution ultrastructure imaging of fractures in human dental tissues
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作者 Tan Sui Siqi Ying +1 位作者 Gabriel Landini Alexander M.Korsunsky 《Theoretical & Applied Mechanics Letters》 CAS 2014年第4期38-41,共4页
Human dental hard tissues are dentine, cementum, and enamel. These are hydrated mineralised composite tissues with a hierarchical structure and versatile thermo-mechanical properties. The hierarchical structure of den... Human dental hard tissues are dentine, cementum, and enamel. These are hydrated mineralised composite tissues with a hierarchical structure and versatile thermo-mechanical properties. The hierarchical structure of dentine and enamel was imaged by transmission electron microscopy (TEM) of samples prepared by focused ion beam (FIB) milling. High resolution TEM was carried out in the vicinity of a crack tip in dentine. An intricate "random weave" pattern of hydroxyapatile crystallites was observed and this provided a possible explanation for toughening of the mineralized dentine tissue at the nano-scale. The results reported here provide the basis for improved understanding of the rela- tionship between the multi-scale nature and the mechanical properties of hierarchically structured biomaterials, and will also be useful for the development of better prosthetic and dental restorative materials. 展开更多
关键词 human dental tissue transmission electron microscopy focused ion beam crack
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Three-dimensional vertical ZnO transistors with suspended top electrodes fabricated by focused ion beam technology
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作者 Chi Sun Linyuan Zhao +4 位作者 Tingting Hao Renrong Liang Haitao Ye Junjie Li Changzhi Gu 《Chinese Physics B》 SCIE EI CAS CSCD 2022年第1期492-496,共5页
Three-dimensional(3D)vertical architecture transistors represent an important technological pursuit,which have distinct advantages in device integration density,operation speed,and power consumption.However,the fabric... Three-dimensional(3D)vertical architecture transistors represent an important technological pursuit,which have distinct advantages in device integration density,operation speed,and power consumption.However,the fabrication processes of such 3D devices are complex,especially in the interconnection of electrodes.In this paper,we present a novel method which combines suspended electrodes and focused ion beam(FIB)technology to greatly simplify the electrodes interconnection in 3D devices.Based on this method,we fabricate 3D vertical core-double shell structure transistors with ZnO channel and Al_(2)O_(3) gate-oxide both grown by atomic layer deposition.Suspended top electrodes of vertical architecture could be directly connected to planar electrodes by FIB deposited Pt nanowires,which avoid cumbersome steps in the traditional 3D structure fabrication technology.Both single pillar and arrays devices show well behaved transfer characteristics with an Ion/Ioff current ratio greater than 106 and a low threshold voltage around 0 V.The ON-current of the 2×2 pillars vertical channel transistor was 1.2μA at the gate voltage of 3 V and drain voltage of 2 V,which can be also improved by increasing the number of pillars.Our method for fabricating vertical architecture transistors can be promising for device applications with high integration density and low power consumption. 展开更多
关键词 three-dimensional(3D)vertical ZnO transistor focused ion beam(FIB) suspended electrodes the electrical inter-connection in 3D devices
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Monte Carlo Si mulation of Damage Depth in Focused Ion Beam Milling Si_3N_4 Thin Film
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作者 TAN Yong-wen XIE Xue-bing +3 位作者 Jack Zhou XU Tian-wei YANG Wei-guo YANG Hai 《Semiconductor Photonics and Technology》 CAS 2007年第4期272-275,288,共5页
The damage properties of Focused Ion Beam(FIB) milling Si3N4 thin film are investigated by the detailed analyzing images of nanoholes and simulation of Monte Carlo. The damage depth in the Si3N4 thin film for two diff... The damage properties of Focused Ion Beam(FIB) milling Si3N4 thin film are investigated by the detailed analyzing images of nanoholes and simulation of Monte Carlo. The damage depth in the Si3N4 thin film for two different ion species(Gallium and Arsenic) under various parameters(ion energy, angle of incidence) are investigated by Monte Carlo method. The simulations show the damage depth increases with the increasing ion energy, the damage depth is dependent on the angle of incident ion, the curves of the damage depth for Ga ion and As ion at 30 keV nearly superpose, while the damage depth for Ga with 90 keV ion is more than that for As ion with the same energy. 展开更多
关键词 monte carlo method focused ion beam effects damage depth
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