Scanning probe microscopy(SPM)is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen.Atomic force microscopy is one of the SPM family which is considered as a very versa...Scanning probe microscopy(SPM)is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen.Atomic force microscopy is one of the SPM family which is considered as a very versatile tool for surface imaging and measurements.A wide range of various samples can be measured regardless of being conductive,no-conductive,in vacuum,in air or in a fluid as a unique feature.One of the most challenges in atomic force microscopes(AFMs)is to evaluate the associated uncertainty during the surface measurements by AFMs.Here,an optical AFM is calibrated through the calibration of XYZ stage.The approach is to overcome difficulties experienced when trying to evaluate some uncertainty components which cannot be experimentally determined i.e.tip surface interaction forces and tip geometry.The Monte Carlo method is then used to determine the associated uncertainties due to such factors by randomly drawing the parameters according to their associated tolerances and their probability density functions(PDFs).The whole process follows supplement 2 to“the guide to the expression of the uncertainty in measurement”(GUM).The approach validated in the paper shows that the evaluated uncertainty in AFM is about 10 nm.展开更多
We fabricate and characterize Au nanoparticle-aggregated nanowires by using the nano meniscus-induced colloidal stacking method. The Au nanoparticle solution ejects with guidance of nanopipette/quartz tuning fork-base...We fabricate and characterize Au nanoparticle-aggregated nanowires by using the nano meniscus-induced colloidal stacking method. The Au nanoparticle solution ejects with guidance of nanopipette/quartz tuning fork-based atomic force microscope in ambient conditions, and the stacking particles form Au nanoparticle-aggregated nanowire while the nozzle retracts from the surface. Their mechanical properties with relatively low elastic modulus are in situ investigated by using the same apparatus.展开更多
Thin films of three types of fullerene derivatives were prepared through the electrospray deposition (ESD) method. The optimized conditions for the fabrication of the thin films were investigated for different types o...Thin films of three types of fullerene derivatives were prepared through the electrospray deposition (ESD) method. The optimized conditions for the fabrication of the thin films were investigated for different types of fullerene derivatives: [6,6]-phenyl-C61-butyric acid methyl ester, [6,6]-phenyl-C71-butyric acid methyl ester, and indene-C60-monoadduct. The spray diameter during the ESD process was observed as a function of the supply rate achieved by changing the applied voltage. In all cases, the spray diameter increased with increasing applied voltage, reaching the maximum diameter (Dmax) in the voltage range 4 to 6 kV. It was clear that Dmax was influenced by the dipole moments of the fullerene derivatives (as calculated by density functional theory methods). Scanning electron microscopy observation of the?fabricated thin films showed that imbricated structures were formed through the stacking of the fullerene-derivative sheets. Atomic force microscopy images revealed that the density of the imbricated structure was dependent on the spray diameter during the ESD process, and the root-mean-square roughness of the film surface decreased with increasing applied voltage. These findings suggest that the ESD method will be effective for the preparation of fullerene-derivative thin films for the production of organic devices.展开更多
We have built an integrated imaging system by combining stimulated emission depletion(STED)microscope and atomic force microscope(AFM).The STED microscope was constructed based on the supercontinuum fiber laser and a ...We have built an integrated imaging system by combining stimulated emission depletion(STED)microscope and atomic force microscope(AFM).The STED microscope was constructed based on the supercontinuum fiber laser and a super lateral resolution of42 nm was achieved.With this integrated imaging system,morphological features,mechanical parameters and fluorescence super resolution imaging were obtained simultaneously for both nanobeads and fixed cell samples.This new integrated imaging system is expected to obtain comprehensive information at the nanoscale for studies in nanobiology and nanomedicine.展开更多
原子力显微镜(atomic force microscope,AFM)是纳米尺度线宽成像和测量的重要工具.但系统的非线性和控制器参数选择的多样性导致AFM控制的不确定性,影响了AFM测量结果的精确性和重复性.为克服这个缺点,分析了AFM的测量原理和工作模式的...原子力显微镜(atomic force microscope,AFM)是纳米尺度线宽成像和测量的重要工具.但系统的非线性和控制器参数选择的多样性导致AFM控制的不确定性,影响了AFM测量结果的精确性和重复性.为克服这个缺点,分析了AFM的测量原理和工作模式的特点,在此基础上提出了一种新的工作模式——补偿模式.在这种工作模式中,结合了扫描器和悬臂梁的位置信息而得到被测试样表面的形貌图像.与恒力接触模式相比,在补偿模式下,AFM能够在高速度下以更好的精确性和重复性进行成像和测量.仿真和实验结果证明了这种新工作模式的可行性和适用性.实验结果说明该工作模式可以提高扫描速度16倍或减小均方根误差到约1/5.展开更多
基金National Institute of Standards(NIS),11211,Egypt。
文摘Scanning probe microscopy(SPM)is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen.Atomic force microscopy is one of the SPM family which is considered as a very versatile tool for surface imaging and measurements.A wide range of various samples can be measured regardless of being conductive,no-conductive,in vacuum,in air or in a fluid as a unique feature.One of the most challenges in atomic force microscopes(AFMs)is to evaluate the associated uncertainty during the surface measurements by AFMs.Here,an optical AFM is calibrated through the calibration of XYZ stage.The approach is to overcome difficulties experienced when trying to evaluate some uncertainty components which cannot be experimentally determined i.e.tip surface interaction forces and tip geometry.The Monte Carlo method is then used to determine the associated uncertainties due to such factors by randomly drawing the parameters according to their associated tolerances and their probability density functions(PDFs).The whole process follows supplement 2 to“the guide to the expression of the uncertainty in measurement”(GUM).The approach validated in the paper shows that the evaluated uncertainty in AFM is about 10 nm.
基金supported by the National Research Foundation of Korea (NRF) Grant funded by the Korea government (MSIP) (No. 200983512)Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology (2013R1A6A3A03063900)the Brain Korea 21
文摘We fabricate and characterize Au nanoparticle-aggregated nanowires by using the nano meniscus-induced colloidal stacking method. The Au nanoparticle solution ejects with guidance of nanopipette/quartz tuning fork-based atomic force microscope in ambient conditions, and the stacking particles form Au nanoparticle-aggregated nanowire while the nozzle retracts from the surface. Their mechanical properties with relatively low elastic modulus are in situ investigated by using the same apparatus.
文摘Thin films of three types of fullerene derivatives were prepared through the electrospray deposition (ESD) method. The optimized conditions for the fabrication of the thin films were investigated for different types of fullerene derivatives: [6,6]-phenyl-C61-butyric acid methyl ester, [6,6]-phenyl-C71-butyric acid methyl ester, and indene-C60-monoadduct. The spray diameter during the ESD process was observed as a function of the supply rate achieved by changing the applied voltage. In all cases, the spray diameter increased with increasing applied voltage, reaching the maximum diameter (Dmax) in the voltage range 4 to 6 kV. It was clear that Dmax was influenced by the dipole moments of the fullerene derivatives (as calculated by density functional theory methods). Scanning electron microscopy observation of the?fabricated thin films showed that imbricated structures were formed through the stacking of the fullerene-derivative sheets. Atomic force microscopy images revealed that the density of the imbricated structure was dependent on the spray diameter during the ESD process, and the root-mean-square roughness of the film surface decreased with increasing applied voltage. These findings suggest that the ESD method will be effective for the preparation of fullerene-derivative thin films for the production of organic devices.
基金supported by the National Basic Research Program of China(2013CB933701)the National Natural Science Foundation of China(91213305,21127901,21121063)Chinese Academy of Sciences
文摘We have built an integrated imaging system by combining stimulated emission depletion(STED)microscope and atomic force microscope(AFM).The STED microscope was constructed based on the supercontinuum fiber laser and a super lateral resolution of42 nm was achieved.With this integrated imaging system,morphological features,mechanical parameters and fluorescence super resolution imaging were obtained simultaneously for both nanobeads and fixed cell samples.This new integrated imaging system is expected to obtain comprehensive information at the nanoscale for studies in nanobiology and nanomedicine.
文摘原子力显微镜(atomic force microscope,AFM)是纳米尺度线宽成像和测量的重要工具.但系统的非线性和控制器参数选择的多样性导致AFM控制的不确定性,影响了AFM测量结果的精确性和重复性.为克服这个缺点,分析了AFM的测量原理和工作模式的特点,在此基础上提出了一种新的工作模式——补偿模式.在这种工作模式中,结合了扫描器和悬臂梁的位置信息而得到被测试样表面的形貌图像.与恒力接触模式相比,在补偿模式下,AFM能够在高速度下以更好的精确性和重复性进行成像和测量.仿真和实验结果证明了这种新工作模式的可行性和适用性.实验结果说明该工作模式可以提高扫描速度16倍或减小均方根误差到约1/5.
